(1992). Beam injection assessment of defects in semiconductors: 2nd International Workshop, Meudon-Bellevue, France 15 - 18 July 1991 ([Bindeeinheit].). Ed. de Physique.
Chicago-Zitierstil (17. Ausg.)Beam Injection Assessment of Defects in Semiconductors: 2nd International Workshop, Meudon-Bellevue, France 15 - 18 July 1991. [Bindeeinheit]. Les Ulis: Ed. de Physique, 1992.
MLA-Zitierstil (9. Ausg.)Beam Injection Assessment of Defects in Semiconductors: 2nd International Workshop, Meudon-Bellevue, France 15 - 18 July 1991. [Bindeeinheit]. Ed. de Physique, 1992.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.