VLSI test principles and architectures: design for testabiblity
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Amsterdam u.a.
Elsevier/Morgan Kaufmann
2006
|
Schriftenreihe: | The Morgan Kaufmann series in systems on silicon
|
Schlagworte: | |
Beschreibung: | XXX, 777 S. graph. Darst. |
ISBN: | 0123705975 9780123705976 |
Internformat
MARC
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Datensatz im Suchindex
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dewey-search | 621.39/5 |
dewey-sort | 3621.39 15 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
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id | DE-604.BV022363807 |
illustrated | Illustrated |
index_date | 2024-07-02T17:04:24Z |
indexdate | 2024-07-09T20:56:00Z |
institution | BVB |
isbn | 0123705975 9780123705976 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015573105 |
oclc_num | 64624834 |
open_access_boolean | |
owner | DE-Aug4 DE-92 DE-634 |
owner_facet | DE-Aug4 DE-92 DE-634 |
physical | XXX, 777 S. graph. Darst. |
publishDate | 2006 |
publishDateSearch | 2006 |
publishDateSort | 2006 |
publisher | Elsevier/Morgan Kaufmann |
record_format | marc |
series2 | The Morgan Kaufmann series in systems on silicon |
spelling | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... Amsterdam u.a. Elsevier/Morgan Kaufmann 2006 XXX, 777 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Morgan Kaufmann series in systems on silicon Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Wang, Laung-Terng Sonstige oth |
spellingShingle | VLSI test principles and architectures design for testabiblity Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
subject_GND | (DE-588)4367264-4 (DE-588)4117388-0 |
title | VLSI test principles and architectures design for testabiblity |
title_auth | VLSI test principles and architectures design for testabiblity |
title_exact_search | VLSI test principles and architectures design for testabiblity |
title_exact_search_txtP | VLSI test principles and architectures design for testabiblity |
title_full | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
title_fullStr | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
title_full_unstemmed | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
title_short | VLSI test principles and architectures |
title_sort | vlsi test principles and architectures design for testabiblity |
title_sub | design for testabiblity |
topic | Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
topic_facet | Circuitos integrados vlsi Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen VLSI |
work_keys_str_mv | AT wanglaungterng vlsitestprinciplesandarchitecturesdesignfortestabiblity |