VLSI test principles and architectures: design for testabiblity
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
Elsevier/Morgan Kaufmann
2006
|
| Schriftenreihe: | The Morgan Kaufmann series in systems on silicon
|
| Schlagworte: | |
| Beschreibung: | XXX, 777 S. graph. Darst. |
| ISBN: | 0123705975 9780123705976 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV022363807 | ||
| 003 | DE-604 | ||
| 005 | 20071024 | ||
| 007 | t | ||
| 008 | 070323s2006 d||| |||| 00||| eng d | ||
| 020 | |a 0123705975 |9 0-12-370597-5 | ||
| 020 | |a 9780123705976 |9 978-0-12-370597-6 | ||
| 035 | |a (OCoLC)64624834 | ||
| 035 | |a (DE-599)BVBBV022363807 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-Aug4 |a DE-92 |a DE-634 | ||
| 050 | 0 | |a TK7874.75 | |
| 082 | 0 | |a 621.39/5 |2 22 | |
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 084 | |a ZN 4950 |0 (DE-625)157424: |2 rvk | ||
| 084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
| 245 | 1 | 0 | |a VLSI test principles and architectures |b design for testabiblity |c ed. by Laung-Terng Wang ... |
| 264 | 1 | |a Amsterdam u.a. |b Elsevier/Morgan Kaufmann |c 2006 | |
| 300 | |a XXX, 777 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a The Morgan Kaufmann series in systems on silicon | |
| 650 | 7 | |a Circuitos integrados vlsi |2 larpcal | |
| 650 | 4 | |a Circuits intégrés à très grande échelle - Conception et construction | |
| 650 | 4 | |a Circuits intégrés à très grande échelle - Essais | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Design | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Wang, Laung-Terng |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015573105 | ||
Datensatz im Suchindex
| _version_ | 1804136413424254976 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV022363807 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874.75 |
| callnumber-search | TK7874.75 |
| callnumber-sort | TK 47874.75 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4030 ZN 4950 ZN 4952 |
| ctrlnum | (OCoLC)64624834 (DE-599)BVBBV022363807 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01740nam a2200481 c 4500</leader><controlfield tag="001">BV022363807</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20071024 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">070323s2006 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0123705975</subfield><subfield code="9">0-12-370597-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780123705976</subfield><subfield code="9">978-0-12-370597-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)64624834</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022363807</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874.75</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4950</subfield><subfield code="0">(DE-625)157424:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI test principles and architectures</subfield><subfield code="b">design for testabiblity</subfield><subfield code="c">ed. by Laung-Terng Wang ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam u.a.</subfield><subfield code="b">Elsevier/Morgan Kaufmann</subfield><subfield code="c">2006</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXX, 777 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">The Morgan Kaufmann series in systems on silicon</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Circuitos integrados vlsi</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits intégrés à très grande échelle - Conception et construction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits intégrés à très grande échelle - Essais</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wang, Laung-Terng</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015573105</subfield></datafield></record></collection> |
| id | DE-604.BV022363807 |
| illustrated | Illustrated |
| index_date | 2024-07-02T17:04:24Z |
| indexdate | 2024-07-09T20:56:00Z |
| institution | BVB |
| isbn | 0123705975 9780123705976 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015573105 |
| oclc_num | 64624834 |
| open_access_boolean | |
| owner | DE-Aug4 DE-92 DE-634 |
| owner_facet | DE-Aug4 DE-92 DE-634 |
| physical | XXX, 777 S. graph. Darst. |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Elsevier/Morgan Kaufmann |
| record_format | marc |
| series2 | The Morgan Kaufmann series in systems on silicon |
| spelling | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... Amsterdam u.a. Elsevier/Morgan Kaufmann 2006 XXX, 777 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Morgan Kaufmann series in systems on silicon Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Wang, Laung-Terng Sonstige oth |
| spellingShingle | VLSI test principles and architectures design for testabiblity Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4117388-0 |
| title | VLSI test principles and architectures design for testabiblity |
| title_auth | VLSI test principles and architectures design for testabiblity |
| title_exact_search | VLSI test principles and architectures design for testabiblity |
| title_exact_search_txtP | VLSI test principles and architectures design for testabiblity |
| title_full | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
| title_fullStr | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
| title_full_unstemmed | VLSI test principles and architectures design for testabiblity ed. by Laung-Terng Wang ... |
| title_short | VLSI test principles and architectures |
| title_sort | vlsi test principles and architectures design for testabiblity |
| title_sub | design for testabiblity |
| topic | Circuitos integrados vlsi larpcal Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Circuitos integrados vlsi Circuits intégrés à très grande échelle - Conception et construction Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Design Integrated circuits Very large scale integration Testing Testen VLSI |
| work_keys_str_mv | AT wanglaungterng vlsitestprinciplesandarchitecturesdesignfortestabiblity |