Measuring knowledge spillovers using Belgian EPO and USPTO patent data:
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Bibliographic Details
Main Authors: Plasmans, Joseph E. J. 1944- (Author), Lukatch, Ruslan (Author)
Format: Book
Language:English
Published: Munich CESifo 2001
Series:CESifo working papers 430
Subjects:
Item Description:Literaturverz. S. 21
Physical Description:21 S. graph. Darst.

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