Scanning force microscopy: with applications to electric, magnetic, and atomic forces
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Oxford Univ. Pr.
1991
|
| Ausgabe: | 1. print. |
| Schriftenreihe: | Oxford series on optical sciences
2 |
| Schlagworte: | |
| Beschreibung: | XI, 253 S. Ill. |
| ISBN: | 0195062701 |
Internformat
MARC
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| 245 | 1 | 0 | |a Scanning force microscopy |b with applications to electric, magnetic, and atomic forces |
| 250 | |a 1. print. | ||
| 264 | 1 | |a New York [u.a.] |b Oxford Univ. Pr. |c 1991 | |
| 300 | |a XI, 253 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 490 | 1 | |a Oxford series on optical sciences |v 2 | |
| 650 | 4 | |a Microscopie à balayage à effet tunnel | |
| 650 | 4 | |a Surfaces (Physique) | |
| 650 | 4 | |a Scanning force microscopy | |
| 650 | 4 | |a Surfaces (Physics) | |
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Datensatz im Suchindex
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| author | Sarid, Dror |
| author_facet | Sarid, Dror |
| author_role | aut |
| author_sort | Sarid, Dror |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV022152711 |
| callnumber-first | Q - Science |
| callnumber-label | QC173 |
| callnumber-raw | QC173.4.S94 QH212.S32 |
| callnumber-search | QC173.4.S94 QH212.S32 |
| callnumber-sort | QC 3173.4 S94 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 6310 |
| ctrlnum | (OCoLC)22708186 (DE-599)BVBBV022152711 |
| dewey-full | 502/.8/2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/2 |
| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| discipline_str_mv | Allgemeine Naturwissenschaft Physik |
| edition | 1. print. |
| format | Book |
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| id | DE-604.BV022152711 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:18:18Z |
| indexdate | 2024-07-09T20:51:27Z |
| institution | BVB |
| isbn | 0195062701 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015367360 |
| oclc_num | 22708186 |
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| owner | DE-706 |
| owner_facet | DE-706 |
| physical | XI, 253 S. Ill. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Oxford Univ. Pr. |
| record_format | marc |
| series | Oxford series on optical sciences |
| series2 | Oxford series on optical sciences |
| spelling | Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces 1. print. New York [u.a.] Oxford Univ. Pr. 1991 XI, 253 S. Ill. txt rdacontent n rdamedia nc rdacarrier Oxford series on optical sciences 2 Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 s DE-604 Abtastsystem (DE-588)4129844-5 s Tunneleffekt (DE-588)4136216-0 s Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s 2\p DE-604 Oxford series on optical sciences 2 (DE-604)BV008283319 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces Oxford series on optical sciences Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Tunneleffekt (DE-588)4136216-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4129844-5 (DE-588)4127823-9 (DE-588)4136216-0 (DE-588)4274473-8 (DE-588)4014326-0 (DE-588)4252995-5 |
| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search_txtP | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Tunneleffekt (DE-588)4136216-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Abtastsystem Festkörperoberfläche Tunneleffekt Rasterkraftmikroskopie Elektronenmikroskop Rastertunnelmikroskopie |
| volume_link | (DE-604)BV008283319 |
| work_keys_str_mv | AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces |