Rational fault analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Dekker
1977
|
| Schriftenreihe: | Electrical engineering and electronics
1 |
| Schlagworte: | |
| Beschreibung: | 241 S. |
| ISBN: | 0824765419 |
Internformat
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Datensatz im Suchindex
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| dewey-search | 621.3815/1/028 |
| dewey-sort | 3621.3815 11 228 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022129296 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T16:16:38Z |
| indexdate | 2024-07-09T20:51:03Z |
| institution | BVB |
| isbn | 0824765419 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015343922 |
| oclc_num | 3002983 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | 241 S. |
| publishDate | 1977 |
| publishDateSearch | 1977 |
| publishDateSort | 1977 |
| publisher | Dekker |
| record_format | marc |
| series | Electrical engineering and electronics |
| series2 | Electrical engineering and electronics |
| spelling | Rational fault analysis ed. by Richard Saeks New York, NY [u.a.] Dekker 1977 241 S. txt rdacontent n rdamedia nc rdacarrier Electrical engineering and electronics 1 Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Programmierung (DE-588)4076370-5 gnd rswk-swf Korrektur (DE-588)4205358-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Programmierung (DE-588)4076370-5 s DE-604 Korrektur (DE-588)4205358-4 s Saeks, Richard Sonstige oth Electrical engineering and electronics 1 (DE-604)BV001899533 |
| spellingShingle | Rational fault analysis Electrical engineering and electronics Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Programmierung (DE-588)4076370-5 gnd Korrektur (DE-588)4205358-4 gnd |
| subject_GND | (DE-588)4076370-5 (DE-588)4205358-4 (DE-588)1071861417 |
| title | Rational fault analysis |
| title_auth | Rational fault analysis |
| title_exact_search | Rational fault analysis |
| title_exact_search_txtP | Rational fault analysis |
| title_full | Rational fault analysis ed. by Richard Saeks |
| title_fullStr | Rational fault analysis ed. by Richard Saeks |
| title_full_unstemmed | Rational fault analysis ed. by Richard Saeks |
| title_short | Rational fault analysis |
| title_sort | rational fault analysis |
| topic | Betrouwbaarheid gtt Elektronica gtt Fouten gtt Testen gtt Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Programmierung (DE-588)4076370-5 gnd Korrektur (DE-588)4205358-4 gnd |
| topic_facet | Betrouwbaarheid Elektronica Fouten Testen Automatic test equipment Congresses Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Programmierung Korrektur Konferenzschrift |
| volume_link | (DE-604)BV001899533 |
| work_keys_str_mv | AT saeksrichard rationalfaultanalysis |