IEEE Instrumentation and Measurement Technology Conference proceedings: 1985 March 20-22, 1985, Tampa, Fla
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York, NY
IEEE
1985
|
| Physical Description: | 285 S. |
Staff View
MARC
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Record in the Search Index
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| publishDate | 1985 |
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| publisher | IEEE |
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| spelling | Instrumentation and Measurement Technology Conference Verfasser (DE-588)306977-1 aut IEEE Instrumentation and Measurement Technology Conference proceedings 1985 March 20-22, 1985, Tampa, Fla IMTC New York, NY IEEE 1985 285 S. txt rdacontent n rdamedia nc rdacarrier (DE-604)BV021864108 1985 |
| spellingShingle | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title_auth | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title_exact_search | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title_exact_search_txtP | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title_full | IEEE Instrumentation and Measurement Technology Conference proceedings 1985 March 20-22, 1985, Tampa, Fla IMTC |
| title_fullStr | IEEE Instrumentation and Measurement Technology Conference proceedings 1985 March 20-22, 1985, Tampa, Fla IMTC |
| title_full_unstemmed | IEEE Instrumentation and Measurement Technology Conference proceedings 1985 March 20-22, 1985, Tampa, Fla IMTC |
| title_short | IEEE Instrumentation and Measurement Technology Conference proceedings |
| title_sort | ieee instrumentation and measurement technology conference proceedings march 20 22 1985 tampa fla |
| volume_link | (DE-604)BV021864108 |
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