Point defects in semiconductors: 1 Theoretical aspects
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
1981
|
| Series: | Springer series in solid-state sciences
22 |
| Physical Description: | XVII, 265 S. graph. Darst. |
| ISBN: | 3540105182 0387105182 |
Staff View
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| id | DE-604.BV022102233 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:15:20Z |
| indexdate | 2024-07-09T20:50:39Z |
| institution | BVB |
| isbn | 3540105182 0387105182 |
| language | English |
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| physical | XVII, 265 S. graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in solid-state sciences |
| series2 | Springer series in solid-state sciences |
| spelling | Lannoo, Michel Verfasser aut Point defects in semiconductors 1 Theoretical aspects M. Lannoo ; J. Bourgoin Berlin [u.a.] Springer 1981 XVII, 265 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in solid-state sciences 22 Springer series in solid-state sciences ... Bourgoin, Jacques Verfasser aut (DE-604)BV021862395 1 Springer series in solid-state sciences 22 (DE-604)BV000016582 |
| spellingShingle | Lannoo, Michel Bourgoin, Jacques Point defects in semiconductors Springer series in solid-state sciences |
| title | Point defects in semiconductors |
| title_auth | Point defects in semiconductors |
| title_exact_search | Point defects in semiconductors |
| title_exact_search_txtP | Point defects in semiconductors |
| title_full | Point defects in semiconductors 1 Theoretical aspects M. Lannoo ; J. Bourgoin |
| title_fullStr | Point defects in semiconductors 1 Theoretical aspects M. Lannoo ; J. Bourgoin |
| title_full_unstemmed | Point defects in semiconductors 1 Theoretical aspects M. Lannoo ; J. Bourgoin |
| title_short | Point defects in semiconductors |
| title_sort | point defects in semiconductors theoretical aspects |
| volume_link | (DE-604)BV021862395 (DE-604)BV000016582 |
| work_keys_str_mv | AT lannoomichel pointdefectsinsemiconductors1 AT bourgoinjacques pointdefectsinsemiconductors1 |