... IEEE International Reliability Physics Symposium proceedings: ... annual 40 (2002) Dallas, Texas, April 7 - 11, 2002
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Bibliographic Details
Corporate Author: International Reliability Physics Symposium (Author)
Format: Conference Proceeding Book
Language:English
Published: Piscataway, NJ Inst. of Electrical and Electronics Engineers 2002
Item Description:Literaturangaben
Physical Description:VIII, 476 S. Ill., graph. Darst.
ISBN:0780373529

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