... IEEE International Reliability Physics Symposium proceedings: ... annual 36 (1998) Reno, Nevada, March 31, April 1, 2, 1998
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
Inst. of Electrical and Electronics Engineers
1998
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | VII, 421 S. Ill., graph. Darst. |
| ISBN: | 0780344006 0780344014 0780344022 |
Internformat
MARC
| LEADER | 00000nam a2200000zcc4500 | ||
|---|---|---|---|
| 001 | BV022081629 | ||
| 003 | DE-604 | ||
| 005 | 19981020000000.0 | ||
| 007 | t | ||
| 008 | 980814s1998 ad|| |||| 10||| eng d | ||
| 020 | |a 0780344006 |9 0-7803-4400-6 | ||
| 020 | |a 0780344014 |9 0-7803-4401-4 | ||
| 020 | |a 0780344022 |9 0-7803-4402-2 | ||
| 035 | |a (OCoLC)39141789 | ||
| 035 | |a (DE-599)BVBBV022081629 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a TK7870 | |
| 111 | 2 | |a International Reliability Physics Symposium |j Verfasser |0 (DE-588)242979-2 |4 aut | |
| 245 | 1 | 0 | |a ... IEEE International Reliability Physics Symposium proceedings |b ... annual |n 36 (1998) |p Reno, Nevada, March 31, April 1, 2, 1998 |
| 264 | 1 | |a Piscataway, NJ |b Inst. of Electrical and Electronics Engineers |c 1998 | |
| 300 | |a VII, 421 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Reliability |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 773 | 0 | 8 | |w (DE-604)BV021858209 |g 36 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015296446 | ||
Datensatz im Suchindex
| _version_ | 1804136057606766592 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Reliability Physics Symposium |
| author_corporate_role | aut |
| author_facet | International Reliability Physics Symposium |
| author_sort | International Reliability Physics Symposium |
| building | Verbundindex |
| bvnumber | BV022081629 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)39141789 (DE-599)BVBBV022081629 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01380nam a2200373zcc4500</leader><controlfield tag="001">BV022081629</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19981020000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980814s1998 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780344006</subfield><subfield code="9">0-7803-4400-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780344014</subfield><subfield code="9">0-7803-4401-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780344022</subfield><subfield code="9">0-7803-4402-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)39141789</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022081629</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)242979-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">... IEEE International Reliability Physics Symposium proceedings</subfield><subfield code="b">... annual</subfield><subfield code="n">36 (1998)</subfield><subfield code="p">Reno, Nevada, March 31, April 1, 2, 1998</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII, 421 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021858209</subfield><subfield code="g">36</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015296446</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022081629 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:14:22Z |
| indexdate | 2024-07-09T20:50:21Z |
| institution | BVB |
| institution_GND | (DE-588)242979-2 |
| isbn | 0780344006 0780344014 0780344022 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015296446 |
| oclc_num | 39141789 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VII, 421 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | International Reliability Physics Symposium Verfasser (DE-588)242979-2 aut ... IEEE International Reliability Physics Symposium proceedings ... annual 36 (1998) Reno, Nevada, March 31, April 1, 2, 1998 Piscataway, NJ Inst. of Electrical and Electronics Engineers 1998 VII, 421 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021858209 36 |
| spellingShingle | ... IEEE International Reliability Physics Symposium proceedings ... annual Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_auth | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_exact_search | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_exact_search_txtP | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_full | ... IEEE International Reliability Physics Symposium proceedings ... annual 36 (1998) Reno, Nevada, March 31, April 1, 2, 1998 |
| title_fullStr | ... IEEE International Reliability Physics Symposium proceedings ... annual 36 (1998) Reno, Nevada, March 31, April 1, 2, 1998 |
| title_full_unstemmed | ... IEEE International Reliability Physics Symposium proceedings ... annual 36 (1998) Reno, Nevada, March 31, April 1, 2, 1998 |
| title_short | ... IEEE International Reliability Physics Symposium proceedings |
| title_sort | ieee international reliability physics symposium proceedings annual reno nevada march 31 april 1 2 1998 |
| title_sub | ... annual |
| topic | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Konferenzschrift |
| volume_link | (DE-604)BV021858209 |
| work_keys_str_mv | AT internationalreliabilityphysicssymposium ieeeinternationalreliabilityphysicssymposiumproceedingsannual361998 |