... IEEE International Reliability Physics Symposium proceedings: ... annual 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Piscataway, NJ
Inst. of Electrical and Electronics Engineers
1997
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| Subjects: | |
| Physical Description: | VI, 384 S. Ill., graph. Darst. |
| ISBN: | 0780335759 0780335767 0780335775 |
Staff View
MARC
| LEADER | 00000nam a2200000zcc4500 | ||
|---|---|---|---|
| 001 | BV022081628 | ||
| 003 | DE-604 | ||
| 005 | 19981020000000.0 | ||
| 007 | t | ||
| 008 | 971030s1997 ad|| |||| 10||| eng d | ||
| 020 | |a 0780335759 |9 0-7803-3575-9 | ||
| 020 | |a 0780335767 |9 0-7803-3576-7 | ||
| 020 | |a 0780335775 |9 0-7803-3577-5 | ||
| 035 | |a (OCoLC)36888308 | ||
| 035 | |a (DE-599)BVBBV022081628 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a TK7870 | |
| 111 | 2 | |a International Reliability Physics Symposium |j Verfasser |0 (DE-588)242979-2 |4 aut | |
| 245 | 1 | 0 | |a ... IEEE International Reliability Physics Symposium proceedings |b ... annual |n 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997 |
| 264 | 1 | |a Piscataway, NJ |b Inst. of Electrical and Electronics Engineers |c 1997 | |
| 300 | |a VI, 384 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Fiabilité - Congrès |2 ram | |
| 650 | 7 | |a Microélectronique - Fiabilité - Congrès |2 ram | |
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 773 | 0 | 8 | |w (DE-604)BV021858209 |g 35 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015296445 | ||
Record in the Search Index
| _version_ | 1804136057596280832 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | International Reliability Physics Symposium |
| author_corporate_role | aut |
| author_facet | International Reliability Physics Symposium |
| author_sort | International Reliability Physics Symposium |
| building | Verbundindex |
| bvnumber | BV022081628 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)36888308 (DE-599)BVBBV022081628 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01261nam a2200349zcc4500</leader><controlfield tag="001">BV022081628</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19981020000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">971030s1997 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780335759</subfield><subfield code="9">0-7803-3575-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780335767</subfield><subfield code="9">0-7803-3576-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780335775</subfield><subfield code="9">0-7803-3577-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)36888308</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV022081628</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)242979-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">... IEEE International Reliability Physics Symposium proceedings</subfield><subfield code="b">... annual</subfield><subfield code="n">35 (1997) : Denver, Colorado, April 8, 9, 10, 1997</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 384 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Fiabilité - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microélectronique - Fiabilité - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV021858209</subfield><subfield code="g">35</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015296445</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV022081628 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:14:22Z |
| indexdate | 2024-07-09T20:50:21Z |
| institution | BVB |
| institution_GND | (DE-588)242979-2 |
| isbn | 0780335759 0780335767 0780335775 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015296445 |
| oclc_num | 36888308 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VI, 384 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | International Reliability Physics Symposium Verfasser (DE-588)242979-2 aut ... IEEE International Reliability Physics Symposium proceedings ... annual 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997 Piscataway, NJ Inst. of Electrical and Electronics Engineers 1997 VI, 384 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses (DE-588)1071861417 Konferenzschrift gnd-content (DE-604)BV021858209 35 |
| spellingShingle | ... IEEE International Reliability Physics Symposium proceedings ... annual Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_auth | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_exact_search | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_exact_search_txtP | ... IEEE International Reliability Physics Symposium proceedings ... annual |
| title_full | ... IEEE International Reliability Physics Symposium proceedings ... annual 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997 |
| title_fullStr | ... IEEE International Reliability Physics Symposium proceedings ... annual 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997 |
| title_full_unstemmed | ... IEEE International Reliability Physics Symposium proceedings ... annual 35 (1997) : Denver, Colorado, April 8, 9, 10, 1997 |
| title_short | ... IEEE International Reliability Physics Symposium proceedings |
| title_sort | ieee international reliability physics symposium proceedings annual |
| title_sub | ... annual |
| topic | Fiabilité - Congrès ram Microélectronique - Fiabilité - Congrès ram Electronic apparatus and appliances Reliability Congresses |
| topic_facet | Fiabilité - Congrès Microélectronique - Fiabilité - Congrès Electronic apparatus and appliances Reliability Congresses Konferenzschrift |
| volume_link | (DE-604)BV021858209 |
| work_keys_str_mv | AT internationalreliabilityphysicssymposium ieeeinternationalreliabilityphysicssymposiumproceedingsannual351997denvercoloradoapril89101997 |