Secondary ion mass spectrometry: 6 Versailles, Paris, France, Sept. 13-18, 1987
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin [u.a.]
Springer
1988
|
| Schriftenreihe: | Springer series in chemical physics
... |
| Beschreibung: | XXVII, 1078 S. Ill., graph. Darst. |
| ISBN: | 0471918326 |
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Datensatz im Suchindex
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| id | DE-604.BV022027461 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:12:30Z |
| indexdate | 2024-07-09T20:49:27Z |
| institution | BVB |
| institution_GND | (DE-588)244977-8 |
| isbn | 0471918326 |
| language | English |
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| physical | XXVII, 1078 S. Ill., graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in chemical physics |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry 6 Versailles, Paris, France, Sept. 13-18, 1987 ed.: A. Benninghoven ... Berlin [u.a.] Springer 1988 XXVII, 1078 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics ... Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth (DE-604)BV022124762 6 Springer series in chemical physics ... (DE-604)BV000000670 |
| spellingShingle | Secondary ion mass spectrometry Springer series in chemical physics |
| title | Secondary ion mass spectrometry |
| title_auth | Secondary ion mass spectrometry |
| title_exact_search | Secondary ion mass spectrometry |
| title_exact_search_txtP | Secondary ion mass spectrometry |
| title_full | Secondary ion mass spectrometry 6 Versailles, Paris, France, Sept. 13-18, 1987 ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry 6 Versailles, Paris, France, Sept. 13-18, 1987 ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry 6 Versailles, Paris, France, Sept. 13-18, 1987 ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry versailles paris france sept 13 18 1987 |
| volume_link | (DE-604)BV022124762 (DE-604)BV000000670 |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometry6 AT sims secondaryionmassspectrometry6 |