Package and solder joint reliability analysed by FEM simulation and experiments:
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Bibliographic Details
Format: Book
Language:English
Published: Oxford Elsevier 2004
Subjects:
Item Description:Literaturangaben. - In: Microelectronics reliability ; 44 (2004),12 : Special section
Physical Description:S. 1892 - 2054 Ill., graph. Darst.

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