Reliability of electron devices, failure physics and analysis: [held from October 4 to 8, 2004]
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Oxford
Elsevier
2004
|
| Subjects: | |
| Item Description: | Literaturangaben. - In: Microelectronics reliability ; 44 (2004),9/11 : Special issue |
| Physical Description: | IX S., S. 1281 - 1890 Ill., graph. Darst. |
Staff View
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| illustrated | Illustrated |
| index_date | 2024-07-02T16:10:49Z |
| indexdate | 2024-07-09T20:48:58Z |
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| physical | IX S., S. 1281 - 1890 Ill., graph. Darst. |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | Elsevier |
| record_format | marc |
| spelling | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] Oxford Elsevier 2004 IX S., S. 1281 - 1890 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Microelectronics reliability ; 44 (2004),9/11 : Special issue Netzwerkanalyse (DE-588)4075298-7 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Schaden (DE-588)4125902-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Netzwerkanalyse (DE-588)4075298-7 s DE-604 Elektronische Schaltung (DE-588)4113419-9 s Schaden (DE-588)4125902-6 s Ciappa, Mauro Sonstige oth ESREF 15 2004 Zürich Sonstige (DE-588)6505022-8 oth |
| spellingShingle | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] Netzwerkanalyse (DE-588)4075298-7 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Schaden (DE-588)4125902-6 gnd |
| subject_GND | (DE-588)4075298-7 (DE-588)4113419-9 (DE-588)4125902-6 (DE-588)1071861417 |
| title | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_auth | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_exact_search | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_exact_search_txtP | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_full | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_fullStr | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_full_unstemmed | Reliability of electron devices, failure physics and analysis [held from October 4 to 8, 2004] |
| title_short | Reliability of electron devices, failure physics and analysis |
| title_sort | reliability of electron devices failure physics and analysis held from october 4 to 8 2004 |
| title_sub | [held from October 4 to 8, 2004] |
| topic | Netzwerkanalyse (DE-588)4075298-7 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Schaden (DE-588)4125902-6 gnd |
| topic_facet | Netzwerkanalyse Elektronische Schaltung Schaden Konferenzschrift |
| work_keys_str_mv | AT ciappamauro reliabilityofelectrondevicesfailurephysicsandanalysisheldfromoctober4to82004 AT esrefzurich reliabilityofelectrondevicesfailurephysicsandanalysisheldfromoctober4to82004 |