(2004). Reliability of electron devices, failure physics and analysis: [held from October 4 to 8, 2004]. Elsevier.
Chicago Style (17th ed.) CitationReliability of Electron Devices, Failure Physics and Analysis: [held from October 4 to 8, 2004]. Oxford: Elsevier, 2004.
MLA (9th ed.) CitationReliability of Electron Devices, Failure Physics and Analysis: [held from October 4 to 8, 2004]. Elsevier, 2004.
Warning: These citations may not always be 100% accurate.