The efficiency of smooth goodness-of-fit tests:
Saved in:
Bibliographic Details
Main Author: Kopecky, Kenneth James (Author)
Format: Book
Language:English
Published: 1980
Subjects:
Item Description:Eugene, Or., Univ., Diss., 1977/78. -Kopie, erschienen im Verl. Univ. Microfilms Internat., Ann Arbor, Mich.
Physical Description:137 Bl. graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!