LEEM PEEM 2: proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2001
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben. - In: Surface science ; 480 (2001),3 |
| Beschreibung: | VII S., S. 97 - 218 Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021964154 | ||
| 003 | DE-604 | ||
| 005 | 20040302000000.0 | ||
| 007 | t | ||
| 008 | 020117s2001 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)47693471 | ||
| 035 | |a (DE-599)BVBBV021964154 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-706 | ||
| 050 | 0 | |a QD506 | |
| 111 | 2 | |a LEEM PEEM Workshop |n 2 |d 2000 |c Paris |j Verfasser |0 (DE-588)6033240-2 |4 aut | |
| 245 | 1 | 0 | |a LEEM PEEM 2 |b proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2001 | |
| 300 | |a VII S., S. 97 - 218 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben. - In: Surface science ; 480 (2001),3 | ||
| 650 | 0 | 7 | |a Photoemissionselektronenmikroskopie |0 (DE-588)4174495-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a LEEM |0 (DE-588)4665416-1 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Photoemissionselektronenmikroskopie |0 (DE-588)4174495-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a LEEM |0 (DE-588)4665416-1 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Bauer, E. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015179304 | ||
Datensatz im Suchindex
| _version_ | 1804135933010771968 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | LEEM PEEM Workshop Paris |
| author_corporate_role | aut |
| author_facet | LEEM PEEM Workshop Paris |
| author_sort | LEEM PEEM Workshop Paris |
| building | Verbundindex |
| bvnumber | BV021964154 |
| callnumber-first | Q - Science |
| callnumber-label | QD506 |
| callnumber-raw | QD506 |
| callnumber-search | QD506 |
| callnumber-sort | QD 3506 |
| callnumber-subject | QD - Chemistry |
| ctrlnum | (OCoLC)47693471 (DE-599)BVBBV021964154 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01258nam a2200361zc 4500</leader><controlfield tag="001">BV021964154</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040302000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020117s2001 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)47693471</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021964154</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QD506</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">LEEM PEEM Workshop</subfield><subfield code="n">2</subfield><subfield code="d">2000</subfield><subfield code="c">Paris</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6033240-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">LEEM PEEM 2</subfield><subfield code="b">proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII S., S. 97 - 218</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben. - In: Surface science ; 480 (2001),3</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Photoemissionselektronenmikroskopie</subfield><subfield code="0">(DE-588)4174495-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">LEEM</subfield><subfield code="0">(DE-588)4665416-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Photoemissionselektronenmikroskopie</subfield><subfield code="0">(DE-588)4174495-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">LEEM</subfield><subfield code="0">(DE-588)4665416-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bauer, E.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015179304</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021964154 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:08:44Z |
| indexdate | 2024-07-09T20:48:22Z |
| institution | BVB |
| institution_GND | (DE-588)6033240-2 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015179304 |
| oclc_num | 47693471 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | VII S., S. 97 - 218 Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Elsevier |
| record_format | marc |
| spelling | LEEM PEEM Workshop 2 2000 Paris Verfasser (DE-588)6033240-2 aut LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 Amsterdam [u.a.] Elsevier 2001 VII S., S. 97 - 218 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: Surface science ; 480 (2001),3 Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd rswk-swf LEEM (DE-588)4665416-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Photoemissionselektronenmikroskopie (DE-588)4174495-0 s DE-604 LEEM (DE-588)4665416-1 s Bauer, E. Sonstige oth |
| spellingShingle | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd LEEM (DE-588)4665416-1 gnd |
| subject_GND | (DE-588)4174495-0 (DE-588)4665416-1 (DE-588)1071861417 |
| title | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_auth | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_exact_search | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_exact_search_txtP | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_full | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_fullStr | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_full_unstemmed | LEEM PEEM 2 proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| title_short | LEEM PEEM 2 |
| title_sort | leem peem 2 proceedings of the 2nd leem peem workshop paris france 26 28 september 2000 |
| title_sub | proceedings of the 2nd LEEM PEEM Workshop ; Paris, France, 26 - 28 September 2000 |
| topic | Photoemissionselektronenmikroskopie (DE-588)4174495-0 gnd LEEM (DE-588)4665416-1 gnd |
| topic_facet | Photoemissionselektronenmikroskopie LEEM Konferenzschrift |
| work_keys_str_mv | AT leempeemworkshopparis leempeem2proceedingsofthe2ndleempeemworkshopparisfrance2628september2000 AT bauere leempeem2proceedingsofthe2ndleempeemworkshopparisfrance2628september2000 |