Special section on ICMTS '98: [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998]
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
Inst. of Electrical and Electronics Engineers
1999
|
Schlagworte: | |
Beschreibung: | Literaturangaben. - In: IEEE transactions on semiconductor manufacturing ; 12 (1999),2 |
Beschreibung: | S. 153 - 268 Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV021954769 | ||
003 | DE-604 | ||
005 | 20240208 | ||
007 | t | ||
008 | 000621s1999 ad|| |||| 10||| eng d | ||
035 | |a (OCoLC)633530356 | ||
035 | |a (DE-599)BVBBV021954769 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
111 | 2 | |a International Conference on Microelectronic Test Structures |n 11 |d 1998 |c Kanazawa |j Verfasser |0 (DE-588)5318567-5 |4 aut | |
245 | 1 | 0 | |a Special section on ICMTS '98 |b [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
264 | 1 | |a New York, NY |b Inst. of Electrical and Electronics Engineers |c 1999 | |
300 | |a S. 153 - 268 |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturangaben. - In: IEEE transactions on semiconductor manufacturing ; 12 (1999),2 | ||
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Testauswertung |0 (DE-588)4124305-5 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | 1 | |a Testauswertung |0 (DE-588)4124305-5 |D s |
689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015169919 |
Datensatz im Suchindex
_version_ | 1804135920749772800 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author_corporate | International Conference on Microelectronic Test Structures Kanazawa |
author_corporate_role | aut |
author_facet | International Conference on Microelectronic Test Structures Kanazawa |
author_sort | International Conference on Microelectronic Test Structures Kanazawa |
building | Verbundindex |
bvnumber | BV021954769 |
ctrlnum | (OCoLC)633530356 (DE-599)BVBBV021954769 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01264nam a2200325zc 4500</leader><controlfield tag="001">BV021954769</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240208 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000621s1999 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633530356</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021954769</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Microelectronic Test Structures</subfield><subfield code="n">11</subfield><subfield code="d">1998</subfield><subfield code="c">Kanazawa</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5318567-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Special section on ICMTS '98</subfield><subfield code="b">[ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">S. 153 - 268</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben. - In: IEEE transactions on semiconductor manufacturing ; 12 (1999),2</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testauswertung</subfield><subfield code="0">(DE-588)4124305-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testauswertung</subfield><subfield code="0">(DE-588)4124305-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015169919</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV021954769 |
illustrated | Illustrated |
index_date | 2024-07-02T16:08:00Z |
indexdate | 2024-07-09T20:48:10Z |
institution | BVB |
institution_GND | (DE-588)5318567-5 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015169919 |
oclc_num | 633530356 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | S. 153 - 268 Ill., graph. Darst. |
publishDate | 1999 |
publishDateSearch | 1999 |
publishDateSort | 1999 |
publisher | Inst. of Electrical and Electronics Engineers |
record_format | marc |
spelling | International Conference on Microelectronic Test Structures 11 1998 Kanazawa Verfasser (DE-588)5318567-5 aut Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] New York, NY Inst. of Electrical and Electronics Engineers 1999 S. 153 - 268 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - In: IEEE transactions on semiconductor manufacturing ; 12 (1999),2 Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Testauswertung (DE-588)4124305-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Testauswertung (DE-588)4124305-5 s DE-604 |
spellingShingle | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] Integrierte Schaltung (DE-588)4027242-4 gnd Testauswertung (DE-588)4124305-5 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4124305-5 (DE-588)1071861417 |
title | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_auth | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_exact_search | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_exact_search_txtP | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_full | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_fullStr | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_full_unstemmed | Special section on ICMTS '98 [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
title_short | Special section on ICMTS '98 |
title_sort | special section on icmts 98 icmts 98 was held in kanazawa japan march 23 26 1998 |
title_sub | [ICMTS '98 was held in Kanazawa, Japan, March 23 - 26, 1998] |
topic | Integrierte Schaltung (DE-588)4027242-4 gnd Testauswertung (DE-588)4124305-5 gnd |
topic_facet | Integrierte Schaltung Testauswertung Konferenzschrift |
work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructureskanazawa specialsectiononicmts98icmts98washeldinkanazawajapanmarch23261998 |