Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York [u.a.]
Wiley
1989
|
| Edition: | 1. print. |
| Series: | A Wiley-Interscience publication
|
| Subjects: | |
| Physical Description: | Getr. Zählung Ill., graph. Darst. |
| ISBN: | 0471519456 |
Staff View
MARC
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| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b a practical handbook for depth profiling and bulk impurity analysis |
| 250 | |a 1. print. | ||
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| 300 | |a Getr. Zählung |b Ill., graph. Darst. | ||
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Record in the Search Index
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| author | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
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| ctrlnum | (OCoLC)20168488 (DE-599)BVBBV021936308 |
| dewey-full | 543/.0873 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
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| dewey-sort | 3543 3873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| discipline_str_mv | Chemie / Pharmazie Physik |
| edition | 1. print. |
| format | Book |
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| id | DE-604.BV021936308 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:06:37Z |
| indexdate | 2024-07-09T20:47:46Z |
| institution | BVB |
| isbn | 0471519456 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015151461 |
| oclc_num | 20168488 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | Getr. Zählung Ill., graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience publication |
| spelling | Wilson, Robert G. Verfasser aut Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis 1. print. New York [u.a.] Wiley 1989 Getr. Zählung Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience publication Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 s DE-604 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s 1\p DE-604 Stevie, Fred A. Verfasser aut Magee, Charles W. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4037882-2 |
| title | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_auth | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_exact_search | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_exact_search_txtP | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_full | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_fullStr | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_full_unstemmed | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_sub | a practical handbook for depth profiling and bulk impurity analysis |
| topic | Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Massenspektrometrie (DE-588)4037882-2 gnd |
| topic_facet | Secondary ion mass spectrometry Sekundärionen-Massenspektrometrie Massenspektrometrie |
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