Semiconductor devices, testing and evaluation:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London
Business Books
1974
|
| Schlagworte: | |
| Beschreibung: | VII, 134 S. Ill. |
Internformat
MARC
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Datensatz im Suchindex
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Illustrated |
| index_date | 2024-07-02T16:05:42Z |
| indexdate | 2024-07-09T20:47:25Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015135551 |
| oclc_num | 1095398 |
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| physical | VII, 134 S. Ill. |
| publishDate | 1974 |
| publishDateSearch | 1974 |
| publishDateSort | 1974 |
| publisher | Business Books |
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| spelling | Jowett, Charles E. Verfasser aut Semiconductor devices, testing and evaluation C. E. Jowett London Business Books 1974 VII, 134 S. Ill. txt rdacontent n rdamedia nc rdacarrier Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Test (DE-588)4059549-3 s DE-604 Halbleiterschaltung (DE-588)4158811-3 s Halbleiterbauelement (DE-588)4113826-0 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Jowett, Charles E. Semiconductor devices, testing and evaluation Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd Test (DE-588)4059549-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4158811-3 (DE-588)4059549-3 (DE-588)4113826-0 |
| title | Semiconductor devices, testing and evaluation |
| title_auth | Semiconductor devices, testing and evaluation |
| title_exact_search | Semiconductor devices, testing and evaluation |
| title_exact_search_txtP | Semiconductor devices, testing and evaluation |
| title_full | Semiconductor devices, testing and evaluation C. E. Jowett |
| title_fullStr | Semiconductor devices, testing and evaluation C. E. Jowett |
| title_full_unstemmed | Semiconductor devices, testing and evaluation C. E. Jowett |
| title_short | Semiconductor devices, testing and evaluation |
| title_sort | semiconductor devices testing and evaluation |
| topic | Semiconductors Testing Halbleiterschaltung (DE-588)4158811-3 gnd Test (DE-588)4059549-3 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Semiconductors Testing Halbleiterschaltung Test Halbleiterbauelement |
| work_keys_str_mv | AT jowettcharlese semiconductordevicestestingandevaluation |