Special issue on VLSI reliability: eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Piscataway, NJ
IEEE Service Center
1993
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| Schlagworte: | |
| Beschreibung: | In: Proceedings of the IEEE. Vol. 81, No. 5, 1993 |
| Beschreibung: | S. 651 - 792 Ill., graph. Darst. |
Internformat
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| index_date | 2024-07-02T16:05:40Z |
| indexdate | 2024-07-09T20:47:24Z |
| institution | BVB |
| language | Undetermined |
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| physical | S. 651 - 792 Ill., graph. Darst. |
| publishDate | 1993 |
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| spelling | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more Piscataway, NJ IEEE Service Center 1993 S. 651 - 792 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier In: Proceedings of the IEEE. Vol. 81, No. 5, 1993 Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 s DE-604 VLSI (DE-588)4117388-0 s |
| spellingShingle | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more Zuverlässigkeit (DE-588)4059245-5 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4117388-0 |
| title | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_auth | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_exact_search | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_exact_search_txtP | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_full | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_fullStr | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_full_unstemmed | Special issue on VLSI reliability eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| title_short | Special issue on VLSI reliability |
| title_sort | special issue on vlsi reliability eleven papers on the vlsi reliability challenge reliability in europe future mosfet reliability electrostatic discharge failure analysis ultra clean processing flash memory and more |
| title_sub | eleven papers on the VLSI reliability challenge, reliability in Europe, future MOSFET reliability, electrostatic discharge, failure analysis, ultra clean processing, flash memory, and more |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Zuverlässigkeit VLSI |