Reliability in electronics: selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Oxford [u.a.]
Pergamon Pr.
1989
|
| Schlagworte: | |
| Beschreibung: | In: Microelectronics and reliability. Vol.29, Nr.3, 1989 |
| Beschreibung: | S. 297-458 graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021891512 | ||
| 003 | DE-604 | ||
| 005 | 20060630000000.0 | ||
| 007 | t | ||
| 008 | 900703s1989 d||| |||| 00||| und d | ||
| 035 | |a (OCoLC)634555514 | ||
| 035 | |a (DE-599)BVBBV021891512 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | |a und | ||
| 049 | |a DE-706 | ||
| 245 | 1 | 0 | |a Reliability in electronics |b selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| 264 | 1 | |a Oxford [u.a.] |b Pergamon Pr. |c 1989 | |
| 300 | |a S. 297-458 |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a In: Microelectronics and reliability. Vol.29, Nr.3, 1989 | ||
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Balogh, André |e Sonstige |4 oth | |
| 711 | 2 | |a Symposium on Reliability in Electronics |n 7 |d 1988 |c Budapest |j Sonstige |0 (DE-588)5003830-8 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-015106712 | ||
Datensatz im Suchindex
| _version_ | 1804135834870349824 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021891512 |
| ctrlnum | (OCoLC)634555514 (DE-599)BVBBV021891512 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01293nam a2200349zc 4500</leader><controlfield tag="001">BV021891512</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060630000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">900703s1989 d||| |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634555514</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021891512</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability in electronics</subfield><subfield code="b">selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford [u.a.]</subfield><subfield code="b">Pergamon Pr.</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">S. 297-458</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">In: Microelectronics and reliability. Vol.29, Nr.3, 1989</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Balogh, André</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Symposium on Reliability in Electronics</subfield><subfield code="n">7</subfield><subfield code="d">1988</subfield><subfield code="c">Budapest</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5003830-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015106712</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV021891512 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:04:11Z |
| indexdate | 2024-07-09T20:46:48Z |
| institution | BVB |
| institution_GND | (DE-588)5003830-8 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015106712 |
| oclc_num | 634555514 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | S. 297-458 graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Pergamon Pr. |
| record_format | marc |
| spelling | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 Oxford [u.a.] Pergamon Pr. 1989 S. 297-458 graph. Darst. txt rdacontent n rdamedia nc rdacarrier In: Microelectronics and reliability. Vol.29, Nr.3, 1989 Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s DE-604 Zuverlässigkeit (DE-588)4059245-5 s Balogh, André Sonstige oth Symposium on Reliability in Electronics 7 1988 Budapest Sonstige (DE-588)5003830-8 oth |
| spellingShingle | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 Zuverlässigkeit (DE-588)4059245-5 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4014346-6 (DE-588)1071861417 |
| title | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_auth | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_exact_search | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_exact_search_txtP | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_full | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_fullStr | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_full_unstemmed | Reliability in electronics selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| title_short | Reliability in electronics |
| title_sort | reliability in electronics selected proceedings of the 7 symposium on reliability in electronics relectronic 88 budapest hungary 29 aug 2 sept 1988 |
| title_sub | selected proceedings of the 7. Symposium on Reliability in Electronics, Relectronic '88 ; Budapest, Hungary, 29 Aug. - 2. Sept. 1988 |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | Zuverlässigkeit Elektronik Konferenzschrift |
| work_keys_str_mv | AT baloghandre reliabilityinelectronicsselectedproceedingsofthe7symposiumonreliabilityinelectronicsrelectronic88budapesthungary29aug2sept1988 AT symposiumonreliabilityinelectronicsbudapest reliabilityinelectronicsselectedproceedingsofthe7symposiumonreliabilityinelectronicsrelectronic88budapesthungary29aug2sept1988 |