Conference record:
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
IEEE
|
Schlagworte: | |
Beschreibung: | Bis 1985 u.d.T.: Instrumentation and Measurement Technology Conference: IEEE Instrumentation and Measurement Technology Conference proceedings. - 1987 und 1994 u.d.T.: Instrumentation and Measurement Technology Conference: Conference proceedings |
Internformat
MARC
LEADER | 00000nam a2200000zca4500 | ||
---|---|---|---|
001 | BV021864114 | ||
003 | DE-604 | ||
005 | 20130411 | ||
007 | t | ||
008 | 860902nuuuuuuuu |||| 10||| eng d | ||
035 | |a (OCoLC)490136574 | ||
035 | |a (DE-599)BVBBV021864114 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
111 | 2 | |a Instrumentation and Measurement Technology Conference |j Verfasser |0 (DE-588)306977-1 |4 aut | |
245 | 1 | 0 | |a Conference record |c Instrumentation and Measurement Conference |
264 | 1 | |a New York, NY |b IEEE | |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Bis 1985 u.d.T.: Instrumentation and Measurement Technology Conference: IEEE Instrumentation and Measurement Technology Conference proceedings. - 1987 und 1994 u.d.T.: Instrumentation and Measurement Technology Conference: Conference proceedings | ||
650 | 7 | |a Capteurs (technologie) - Congrès |2 ram | |
650 | 7 | |a Mesure - Congrès |2 ram | |
650 | 7 | |a Mesure, Instruments de - congrès |2 ram | |
650 | 0 | 7 | |a Gerätebau |0 (DE-588)4020300-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Messgerät |0 (DE-588)4038825-6 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
689 | 0 | 0 | |a Gerätebau |0 (DE-588)4020300-1 |D s |
689 | 0 | 1 | |a Messgerät |0 (DE-588)4038825-6 |D s |
689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-015079916 |
Datensatz im Suchindex
_version_ | 1804135801843351552 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author_corporate | Instrumentation and Measurement Technology Conference |
author_corporate_role | aut |
author_facet | Instrumentation and Measurement Technology Conference |
author_sort | Instrumentation and Measurement Technology Conference |
building | Verbundindex |
bvnumber | BV021864114 |
ctrlnum | (OCoLC)490136574 (DE-599)BVBBV021864114 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01366nam a2200337zca4500</leader><controlfield tag="001">BV021864114</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130411 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">860902nuuuuuuuu |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)490136574</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021864114</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Instrumentation and Measurement Technology Conference</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)306977-1</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Conference record</subfield><subfield code="c">Instrumentation and Measurement Conference</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">IEEE</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Bis 1985 u.d.T.: Instrumentation and Measurement Technology Conference: IEEE Instrumentation and Measurement Technology Conference proceedings. - 1987 und 1994 u.d.T.: Instrumentation and Measurement Technology Conference: Conference proceedings</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Capteurs (technologie) - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mesure - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Mesure, Instruments de - congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gerätebau</subfield><subfield code="0">(DE-588)4020300-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messgerät</subfield><subfield code="0">(DE-588)4038825-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gerätebau</subfield><subfield code="0">(DE-588)4020300-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Messgerät</subfield><subfield code="0">(DE-588)4038825-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015079916</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV021864114 |
illustrated | Not Illustrated |
index_date | 2024-07-02T16:02:57Z |
indexdate | 2024-07-09T20:46:17Z |
institution | BVB |
institution_GND | (DE-588)306977-1 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015079916 |
oclc_num | 490136574 |
open_access_boolean | |
publishDateSort | 0000 |
publisher | IEEE |
record_format | marc |
spelling | Instrumentation and Measurement Technology Conference Verfasser (DE-588)306977-1 aut Conference record Instrumentation and Measurement Conference New York, NY IEEE txt rdacontent n rdamedia nc rdacarrier Bis 1985 u.d.T.: Instrumentation and Measurement Technology Conference: IEEE Instrumentation and Measurement Technology Conference proceedings. - 1987 und 1994 u.d.T.: Instrumentation and Measurement Technology Conference: Conference proceedings Capteurs (technologie) - Congrès ram Mesure - Congrès ram Mesure, Instruments de - congrès ram Gerätebau (DE-588)4020300-1 gnd rswk-swf Messgerät (DE-588)4038825-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Gerätebau (DE-588)4020300-1 s Messgerät (DE-588)4038825-6 s DE-604 |
spellingShingle | Conference record Capteurs (technologie) - Congrès ram Mesure - Congrès ram Mesure, Instruments de - congrès ram Gerätebau (DE-588)4020300-1 gnd Messgerät (DE-588)4038825-6 gnd |
subject_GND | (DE-588)4020300-1 (DE-588)4038825-6 (DE-588)1071861417 |
title | Conference record |
title_auth | Conference record |
title_exact_search | Conference record |
title_exact_search_txtP | Conference record |
title_full | Conference record Instrumentation and Measurement Conference |
title_fullStr | Conference record Instrumentation and Measurement Conference |
title_full_unstemmed | Conference record Instrumentation and Measurement Conference |
title_short | Conference record |
title_sort | conference record |
topic | Capteurs (technologie) - Congrès ram Mesure - Congrès ram Mesure, Instruments de - congrès ram Gerätebau (DE-588)4020300-1 gnd Messgerät (DE-588)4038825-6 gnd |
topic_facet | Capteurs (technologie) - Congrès Mesure - Congrès Mesure, Instruments de - congrès Gerätebau Messgerät Konferenzschrift |
work_keys_str_mv | AT instrumentationandmeasurementtechnologyconference conferencerecord |