APA (7th ed.) Citation

(2006). Semiconductor material and device characterization (3. ed.). Wiley-Interscience [u.a.].

Chicago Style (17th ed.) Citation

Semiconductor Material and Device Characterization. 3. ed. Hoboken, NJ: Wiley-Interscience [u.a.], 2006.

MLA (9th ed.) Citation

Semiconductor Material and Device Characterization. 3. ed. Wiley-Interscience [u.a.], 2006.