Fault diagnosis and tolerance in cryptography: third international workshop, FDTC 2006, Yokohama, Japan, October 10, 2006 ; proceedings
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Berlin [u.a.] Springer 2006
Series:Lecture notes in computer science 4236
Subjects:
Physical Description:XIII, 251 S. graph. Darst.
ISBN:9783540462507
3540462503

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