ITC -International Test Conference 2001: October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM
Saved in:
| Format: | Electronic Conference Proceeding Software eBook |
|---|---|
| Language: | English |
| Published: |
Piscataway, NJ
IEEE
2001
|
| Subjects: | |
| Physical Description: | 1 CD-ROM 12 cm |
| ISBN: | 0780371712 |
Staff View
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| illustrated | Not Illustrated |
| index_date | 2024-07-02T15:43:05Z |
| indexdate | 2024-07-09T20:44:04Z |
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| isbn | 0780371712 |
| language | English |
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| physical | 1 CD-ROM 12 cm |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | IEEE |
| record_format | marc |
| spelling | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM Tackling test trade-offs Piscataway, NJ IEEE 2001 1 CD-ROM 12 cm txt rdacontent c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 30.10.2001-01.11.2001 Baltimore, Md. gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Testen (DE-588)4367264-4 s International Test Conference 2001 Baltimore, Md. Sonstige (DE-588)5536593-0 oth |
| spellingShingle | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM Mikroelektronik (DE-588)4039207-7 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4367264-4 (DE-588)4027242-4 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_alt | Tackling test trade-offs |
| title_auth | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_exact_search | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_exact_search_txtP | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_full | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_fullStr | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_full_unstemmed | ITC -International Test Conference 2001 October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| title_short | ITC -International Test Conference 2001 |
| title_sort | itc international test conference 2001 october 30 november 1 2001 baltimore md usa tackling test trade offs proceedings on cd rom |
| title_sub | October 30 - November 1, 2001, Baltimore, MD, USA ; Tackling test trade-offs ; [proceedings on CD-ROM |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Testen (DE-588)4367264-4 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Testen Integrierte Schaltung Prüftechnik Konferenzschrift 30.10.2001-01.11.2001 Baltimore, Md. |
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