Interferogram analysis for optical testing:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Boca Raton, FL
Taylor & Francis
2005
|
| Edition: | 2nd ed. |
| Subjects: | |
| Online Access: | Publisher description |
| Physical Description: | 1 Online-Ressource |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV021755137 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 061005s2005 xxu|||| o||u| ||||||eng d | ||
| 010 | |a 2004056966 | ||
| 035 | |a (OCoLC)228119807 | ||
| 035 | |a (DE-599)BVBBV021755137 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 050 | 0 | |a QC367 | |
| 082 | 0 | |a 681/.25 | |
| 084 | |a UH 5400 |0 (DE-625)145660: |2 rvk | ||
| 245 | 1 | 0 | |a Interferogram analysis for optical testing |c Daniel Malacara ... |
| 250 | |a 2nd ed. | ||
| 264 | 1 | |a Boca Raton, FL |b Taylor & Francis |c 2005 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Figures de diffraction - Informatique | |
| 650 | 7 | |a Interferômetros |2 larpcal | |
| 650 | 4 | |a Interféromètres | |
| 650 | 4 | |a Interférométrie | |
| 650 | 4 | |a Mesures optiques | |
| 650 | 7 | |a Óptica (medidas) |2 larpcal | |
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Optical measurements | |
| 650 | 4 | |a Interferometry | |
| 650 | 4 | |a Interferometers | |
| 650 | 4 | |a Diffraction patterns |x Data processing | |
| 650 | 0 | 7 | |a Interferometrie |0 (DE-588)4027296-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Interferometrie |0 (DE-588)4027296-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Malacara, Daniel |e Sonstige |4 oth | |
| 856 | 4 | |u http://www.loc.gov/catdir/enhancements/fy0648/2004056966-d.html |3 Publisher description | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-014968303 | ||
Record in the Search Index
| _version_ | 1804135614319165440 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| building | Verbundindex |
| bvnumber | BV021755137 |
| callnumber-first | Q - Science |
| callnumber-label | QC367 |
| callnumber-raw | QC367 |
| callnumber-search | QC367 |
| callnumber-sort | QC 3367 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 5400 |
| ctrlnum | (OCoLC)228119807 (DE-599)BVBBV021755137 |
| dewey-full | 681/.25 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 681 - Precision instruments and other devices |
| dewey-raw | 681/.25 |
| dewey-search | 681/.25 |
| dewey-sort | 3681 225 |
| dewey-tens | 680 - Manufacture of products for specific uses |
| discipline | Physik Handwerk und Gewerbe / Verschiedene Technologien |
| discipline_str_mv | Physik Handwerk und Gewerbe / Verschiedene Technologien |
| edition | 2nd ed. |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01507nmm a2200481zc 4500</leader><controlfield tag="001">BV021755137</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">061005s2005 xxu|||| o||u| ||||||eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2004056966</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)228119807</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021755137</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC367</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681/.25</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5400</subfield><subfield code="0">(DE-625)145660:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Interferogram analysis for optical testing</subfield><subfield code="c">Daniel Malacara ...</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton, FL</subfield><subfield code="b">Taylor & Francis</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Figures de diffraction - Informatique</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Interferômetros</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Interféromètres</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Interférométrie</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mesures optiques</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Óptica (medidas)</subfield><subfield code="2">larpcal</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Interferometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Interferometers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Diffraction patterns</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Interferometrie</subfield><subfield code="0">(DE-588)4027296-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Interferometrie</subfield><subfield code="0">(DE-588)4027296-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Malacara, Daniel</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2=" "><subfield code="u">http://www.loc.gov/catdir/enhancements/fy0648/2004056966-d.html</subfield><subfield code="3">Publisher description</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-014968303</subfield></datafield></record></collection> |
| id | DE-604.BV021755137 |
| illustrated | Not Illustrated |
| index_date | 2024-07-02T15:33:14Z |
| indexdate | 2024-07-09T20:43:18Z |
| institution | BVB |
| language | English |
| lccn | 2004056966 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014968303 |
| oclc_num | 228119807 |
| open_access_boolean | |
| physical | 1 Online-Ressource |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Taylor & Francis |
| record_format | marc |
| spelling | Interferogram analysis for optical testing Daniel Malacara ... 2nd ed. Boca Raton, FL Taylor & Francis 2005 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Figures de diffraction - Informatique Interferômetros larpcal Interféromètres Interférométrie Mesures optiques Óptica (medidas) larpcal Datenverarbeitung Optical measurements Interferometry Interferometers Diffraction patterns Data processing Interferometrie (DE-588)4027296-5 gnd rswk-swf Interferometrie (DE-588)4027296-5 s DE-604 Malacara, Daniel Sonstige oth http://www.loc.gov/catdir/enhancements/fy0648/2004056966-d.html Publisher description |
| spellingShingle | Interferogram analysis for optical testing Figures de diffraction - Informatique Interferômetros larpcal Interféromètres Interférométrie Mesures optiques Óptica (medidas) larpcal Datenverarbeitung Optical measurements Interferometry Interferometers Diffraction patterns Data processing Interferometrie (DE-588)4027296-5 gnd |
| subject_GND | (DE-588)4027296-5 |
| title | Interferogram analysis for optical testing |
| title_auth | Interferogram analysis for optical testing |
| title_exact_search | Interferogram analysis for optical testing |
| title_exact_search_txtP | Interferogram analysis for optical testing |
| title_full | Interferogram analysis for optical testing Daniel Malacara ... |
| title_fullStr | Interferogram analysis for optical testing Daniel Malacara ... |
| title_full_unstemmed | Interferogram analysis for optical testing Daniel Malacara ... |
| title_short | Interferogram analysis for optical testing |
| title_sort | interferogram analysis for optical testing |
| topic | Figures de diffraction - Informatique Interferômetros larpcal Interféromètres Interférométrie Mesures optiques Óptica (medidas) larpcal Datenverarbeitung Optical measurements Interferometry Interferometers Diffraction patterns Data processing Interferometrie (DE-588)4027296-5 gnd |
| topic_facet | Figures de diffraction - Informatique Interferômetros Interféromètres Interférométrie Mesures optiques Óptica (medidas) Datenverarbeitung Optical measurements Interferometry Interferometers Diffraction patterns Data processing Interferometrie |
| url | http://www.loc.gov/catdir/enhancements/fy0648/2004056966-d.html |
| work_keys_str_mv | AT malacaradaniel interferogramanalysisforopticaltesting |