Atom probe field ion microscopy: field ion emission and surfaces and interfaces at atomic resolution
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge [u.a.]
Cambridge Univ. Press
2005
|
| Ausgabe: | digitally print., 1. paperback version |
| Schlagworte: | |
| Beschreibung: | X, 387 S. Ill., graph. Darst. |
| ISBN: | 0521019931 0521363799 |
Internformat
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Datensatz im Suchindex
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.82 |
| dewey-search | 502.82 |
| dewey-sort | 3502.82 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| discipline_str_mv | Allgemeine Naturwissenschaft Physik |
| edition | digitally print., 1. paperback version |
| format | Book |
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| id | DE-604.BV021689170 |
| illustrated | Illustrated |
| index_date | 2024-07-02T15:13:53Z |
| indexdate | 2024-07-09T20:41:43Z |
| institution | BVB |
| isbn | 0521019931 0521363799 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014903261 |
| oclc_num | 60418176 |
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| owner_facet | DE-355 DE-BY-UBR DE-29T |
| physical | X, 387 S. Ill., graph. Darst. |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Cambridge Univ. Press |
| record_format | marc |
| spelling | Tsong, Tien Tzou 1934- Verfasser (DE-588)141397187 aut Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong Atom-probe field ion miroscopy digitally print., 1. paperback version Cambridge [u.a.] Cambridge Univ. Press 2005 X, 387 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s DE-604 |
| spellingShingle | Tsong, Tien Tzou 1934- Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4153929-1 |
| title | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_alt | Atom-probe field ion miroscopy |
| title_auth | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_exact_search | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_exact_search_txtP | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_full | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_fullStr | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_full_unstemmed | Atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution Tien T. Tsong |
| title_short | Atom probe field ion microscopy |
| title_sort | atom probe field ion microscopy field ion emission and surfaces and interfaces at atomic resolution |
| title_sub | field ion emission and surfaces and interfaces at atomic resolution |
| topic | Atom-probe field ion microscopy Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Atom-probe field ion microscopy Feldionenmikroskopie |
| work_keys_str_mv | AT tsongtientzou atomprobefieldionmicroscopyfieldionemissionandsurfacesandinterfacesatatomicresolution AT tsongtientzou atomprobefieldionmiroscopy |