Test design for analog integrated circuits:
Saved in:
Bibliographic Details
Main Author: Pronath, Michael (Author)
Format: Thesis Book
Language:English
Published: München Verl. Dr. Hut 2006
Edition:1. Aufl.
Series:Elektronik
Subjects:
Physical Description:194 S. graph. Darst.
ISBN:3899633296

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!