Test design for analog integrated circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
München
Verl. Dr. Hut
2006
|
| Ausgabe: | 1. Aufl. |
| Schriftenreihe: | Elektronik
|
| Schlagworte: | |
| Beschreibung: | 194 S. graph. Darst. |
| ISBN: | 3899633296 |
Internformat
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| 100 | 1 | |a Pronath, Michael |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Test design for analog integrated circuits |c Michael Pronath |
| 250 | |a 1. Aufl. | ||
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| 300 | |a 194 S. |b graph. Darst. | ||
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| 490 | 0 | |a Elektronik | |
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Datensatz im Suchindex
| _version_ | 1804135390513201152 |
|---|---|
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| author | Pronath, Michael |
| author_facet | Pronath, Michael |
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| author_sort | Pronath, Michael |
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| building | Verbundindex |
| bvnumber | BV021605778 |
| classification_tum | ELT 346d ELT 395d |
| ctrlnum | (OCoLC)162322844 (DE-599)BVBBV021605778 |
| discipline | Elektrotechnik |
| discipline_str_mv | Elektrotechnik |
| edition | 1. Aufl. |
| format | Thesis Book |
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| id | DE-604.BV021605778 |
| illustrated | Illustrated |
| index_date | 2024-07-02T14:49:10Z |
| indexdate | 2024-07-09T20:39:45Z |
| institution | BVB |
| isbn | 3899633296 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014821060 |
| oclc_num | 162322844 |
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| owner_facet | DE-91 DE-BY-TUM DE-12 DE-634 DE-83 |
| physical | 194 S. graph. Darst. |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Verl. Dr. Hut |
| record_format | marc |
| series2 | Elektronik |
| spelling | Pronath, Michael Verfasser aut Test design for analog integrated circuits Michael Pronath 1. Aufl. München Verl. Dr. Hut 2006 194 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronik Zugl.: München, Techn. Univ., Diss., 2005 Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Testbarkeit (DE-588)4271826-0 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Mixed-Signal-Schaltung (DE-588)4756481-7 s Analoge integrierte Schaltung (DE-588)4112519-8 s Testbarkeit (DE-588)4271826-0 s Prüftechnik (DE-588)4047610-8 s DE-604 |
| spellingShingle | Pronath, Michael Test design for analog integrated circuits Analoge integrierte Schaltung (DE-588)4112519-8 gnd Prüftechnik (DE-588)4047610-8 gnd Testbarkeit (DE-588)4271826-0 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd |
| subject_GND | (DE-588)4112519-8 (DE-588)4047610-8 (DE-588)4271826-0 (DE-588)4756481-7 (DE-588)4113937-9 |
| title | Test design for analog integrated circuits |
| title_auth | Test design for analog integrated circuits |
| title_exact_search | Test design for analog integrated circuits |
| title_exact_search_txtP | Test design for analog integrated circuits |
| title_full | Test design for analog integrated circuits Michael Pronath |
| title_fullStr | Test design for analog integrated circuits Michael Pronath |
| title_full_unstemmed | Test design for analog integrated circuits Michael Pronath |
| title_short | Test design for analog integrated circuits |
| title_sort | test design for analog integrated circuits |
| topic | Analoge integrierte Schaltung (DE-588)4112519-8 gnd Prüftechnik (DE-588)4047610-8 gnd Testbarkeit (DE-588)4271826-0 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd |
| topic_facet | Analoge integrierte Schaltung Prüftechnik Testbarkeit Mixed-Signal-Schaltung Hochschulschrift |
| work_keys_str_mv | AT pronathmichael testdesignforanalogintegratedcircuits |