8th International Symposium on Laser Metrology: macro-, micro-, and nano-technologies applied in science, engineering, and industry (LM-2005) ; February 14 - 18, 2005, Merida, Yucatán, Mexico ; [abstracts]
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Bibliographic Details
Corporate Author: International Symposium on Laser Metrology: Macro-, Micro-, and Nano-Technologies Applied in Science, Engineering, and Industry Mérida, Yucatán (Author)
Format: Conference Proceeding Book
Language:English
Published: [León] Centro de Investigaciones en Optica (CIO) 2005
Subjects:
Physical Description:XXII, 205 S. Ill., graph. Darst.

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