Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | German |
| Published: |
Garching
Verein zur Förderung des Walter Schottky Inst. der Techn. Univ. München e.V.
2006
|
| Edition: | 1. Aufl. |
| Series: | Selected topics of semiconductor physics and technology
74 |
| Subjects: | |
| Item Description: | Zugl.: München, Techn. Univ., Diss., 2005 |
| Physical Description: | XII, 154 S. Ill., graph. Darst. |
| ISBN: | 393274974x |
Staff View
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Record in the Search Index
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| author | Bougeard, Dominique |
| author_facet | Bougeard, Dominique |
| author_role | aut |
| author_sort | Bougeard, Dominique |
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| building | Verbundindex |
| bvnumber | BV021555891 |
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| discipline | Physik |
| discipline_str_mv | Physik |
| edition | 1. Aufl. |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV021555891 |
| illustrated | Illustrated |
| index_date | 2024-07-02T14:33:01Z |
| indexdate | 2024-07-09T20:38:32Z |
| institution | BVB |
| isbn | 393274974x |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-014771898 |
| oclc_num | 162267355 |
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| owner_facet | DE-91 DE-BY-TUM DE-12 |
| physical | XII, 154 S. Ill., graph. Darst. |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Verein zur Förderung des Walter Schottky Inst. der Techn. Univ. München e.V. |
| record_format | marc |
| series | Selected topics of semiconductor physics and technology |
| series2 | Selected topics of semiconductor physics and technology |
| spelling | Bougeard, Dominique Verfasser aut Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium Dominique Bougeard 1. Aufl. Garching Verein zur Förderung des Walter Schottky Inst. der Techn. Univ. München e.V. 2006 XII, 154 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Selected topics of semiconductor physics and technology 74 Zugl.: München, Techn. Univ., Diss., 2005 Silicium (DE-588)4077445-4 gnd rswk-swf Quantenpunkt (DE-588)4263396-5 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Substrat Mikroelektronik (DE-588)4229622-5 gnd rswk-swf Germanium (DE-588)4135644-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Germanium (DE-588)4135644-5 s Quantenpunkt (DE-588)4263396-5 s Silicium (DE-588)4077445-4 s Substrat Mikroelektronik (DE-588)4229622-5 s Spektroskopie (DE-588)4056138-0 s DE-604 Selected topics of semiconductor physics and technology 74 (DE-604)BV011499438 74 |
| spellingShingle | Bougeard, Dominique Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium Selected topics of semiconductor physics and technology Silicium (DE-588)4077445-4 gnd Quantenpunkt (DE-588)4263396-5 gnd Spektroskopie (DE-588)4056138-0 gnd Substrat Mikroelektronik (DE-588)4229622-5 gnd Germanium (DE-588)4135644-5 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4263396-5 (DE-588)4056138-0 (DE-588)4229622-5 (DE-588)4135644-5 (DE-588)4113937-9 |
| title | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium |
| title_auth | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium |
| title_exact_search | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium |
| title_exact_search_txtP | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium |
| title_full | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium Dominique Bougeard |
| title_fullStr | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium Dominique Bougeard |
| title_full_unstemmed | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium Dominique Bougeard |
| title_short | Spektroskopische Charakterisierung von Germanium-Quantenpunkten in Silizium |
| title_sort | spektroskopische charakterisierung von germanium quantenpunkten in silizium |
| topic | Silicium (DE-588)4077445-4 gnd Quantenpunkt (DE-588)4263396-5 gnd Spektroskopie (DE-588)4056138-0 gnd Substrat Mikroelektronik (DE-588)4229622-5 gnd Germanium (DE-588)4135644-5 gnd |
| topic_facet | Silicium Quantenpunkt Spektroskopie Substrat Mikroelektronik Germanium Hochschulschrift |
| volume_link | (DE-604)BV011499438 |
| work_keys_str_mv | AT bougearddominique spektroskopischecharakterisierungvongermaniumquantenpunkteninsilizium |