Computing system reliability: models and analysis
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Bibliographic Details
Main Authors: Xie, Min 1963- (Author), Dai, Yuan-Shun (Author), Poh, Kim-Leng (Author)
Format: Book
Language:English
Published: New York Kluwer Academic/Plenum Publishers c2004
Subjects:
Physical Description:xiii, 293 p. ill.
ISBN:030648496X

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