Nanohärtemessung mit dem Rasterkraftmikroskop:
Saved in:
Bibliographic Details
Main Author: Kempf, Markus (Author)
Format: Thesis Book
Language:German
Published: Osnabrück <<Der>> Andere Verl. 2002
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:XII, 160 S. Ill., graph. Darst.
ISBN:3899590074

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes