Introduction to focused ion beams: instrumentation, theory, techniques and practice
Saved in:
Bibliographic Details
Format: Book
Language:English
Published: New York, NY Springer 2005
Subjects:
Physical Description:xiv, 357 S. Ill., graph. Darst.
ISBN:0387231161
038723313x

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!