Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces:
Saved in:
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
2004
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| Subjects: | |
| Item Description: | München, Techn. Univ., Diss., 2004 |
| Physical Description: | 133 S. Ill., graph. Darst. |
Staff View
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Record in the Search Index
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| language | English |
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| spelling | Linke, Felix Verfasser aut Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke 2004 133 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier München, Techn. Univ., Diss., 2004 Mikroskopie (DE-588)4039238-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Ellipsometrie (DE-588)4152025-7 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Dünne Schicht (DE-588)4136925-7 s Ellipsometrie (DE-588)4152025-7 s Mikroskopie (DE-588)4039238-7 s DE-604 |
| spellingShingle | Linke, Felix Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Mikroskopie (DE-588)4039238-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| subject_GND | (DE-588)4039238-7 (DE-588)4136925-7 (DE-588)4152025-7 (DE-588)4113937-9 |
| title | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_auth | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_exact_search | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_full | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_fullStr | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_full_unstemmed | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_short | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_sort | development of ellipsometric microscopy as a quantitative high resolution technique for the investigation of thin films at glass water and silicon air interfaces |
| topic | Mikroskopie (DE-588)4039238-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Ellipsometrie (DE-588)4152025-7 gnd |
| topic_facet | Mikroskopie Dünne Schicht Ellipsometrie Hochschulschrift |
| work_keys_str_mv | AT linkefelix developmentofellipsometricmicroscopyasaquantitativehighresolutiontechniquefortheinvestigationofthinfilmsatglasswaterandsiliconairinterfaces |