Linke, F. (2004). Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces.
Chicago Style (17th ed.) CitationLinke, Felix. Development of Ellipsometric Microscopy as a Quantitative High-resolution Technique for the Investigation of Thin Films at Glass-water and Silicon-air Interfaces. 2004.
MLA (9th ed.) CitationLinke, Felix. Development of Ellipsometric Microscopy as a Quantitative High-resolution Technique for the Investigation of Thin Films at Glass-water and Silicon-air Interfaces. 2004.
Warning: These citations may not always be 100% accurate.