Linke, F. (2004). Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces.
Chicago-Zitierstil (17. Ausg.)Linke, Felix. Development of Ellipsometric Microscopy as a Quantitative High-resolution Technique for the Investigation of Thin Films at Glass-water and Silicon-air Interfaces. 2004.
MLA-Zitierstil (9. Ausg.)Linke, Felix. Development of Ellipsometric Microscopy as a Quantitative High-resolution Technique for the Investigation of Thin Films at Glass-water and Silicon-air Interfaces. 2004.
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