A BIST (built-in self-test) strategy for mixed-signal integrated circuits:
Saved in:
| Main Author: | |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
2004
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| Subjects: | |
| Online Access: | Volltext http://d-nb.info/973090375/34 Volltext |
| Item Description: | Erlangen-Nürnberg, Univ., Diss., 2004 |
| Physical Description: | 1 Online-Ressource |
Staff View
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Record in the Search Index
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| author_facet | Li, Hongzhi |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-09T20:01:38Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012955679 |
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| publishDate | 2004 |
| publishDateSearch | 2004 |
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| spelling | Li, Hongzhi Verfasser aut A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li 2004 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Erlangen-Nürnberg, Univ., Diss., 2004 Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Built-in self test (DE-588)4516486-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Built-in self test (DE-588)4516486-1 s b DE-604 https://open.fau.de/handle/openfau/92 Verlag kostenfrei Volltext http://d-nb.info/973090375/34 https://nbn-resolving.org/urn:nbn:de:bvb:29-opus-1036 Verlag kostenfrei Volltext |
| spellingShingle | Li, Hongzhi A BIST (built-in self-test) strategy for mixed-signal integrated circuits Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Built-in self test (DE-588)4516486-1 gnd |
| subject_GND | (DE-588)4756481-7 (DE-588)4027242-4 (DE-588)4516486-1 (DE-588)4113937-9 |
| title | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_auth | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_exact_search | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_full | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_fullStr | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_full_unstemmed | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_short | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_sort | a bist built in self test strategy for mixed signal integrated circuits |
| topic | Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Built-in self test (DE-588)4516486-1 gnd |
| topic_facet | Mixed-Signal-Schaltung Integrierte Schaltung Built-in self test Hochschulschrift |
| url | https://open.fau.de/handle/openfau/92 http://d-nb.info/973090375/34 https://nbn-resolving.org/urn:nbn:de:bvb:29-opus-1036 |
| work_keys_str_mv | AT lihongzhi abistbuiltinselfteststrategyformixedsignalintegratedcircuits |