A BIST (built-in self-test) strategy for mixed-signal integrated circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English German |
| Veröffentlicht: |
2004
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| Schlagworte: | |
| Beschreibung: | Erlangen-Nürnberg, Univ., Diss., 2004. - Enth. Zsfassung in dt. und engl. Sprache |
| Beschreibung: | X, 172 S. Ill., graph. Darst. |
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Datensatz im Suchindex
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| author | Li, Hongzhi |
| author_facet | Li, Hongzhi |
| author_role | aut |
| author_sort | Li, Hongzhi |
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| building | Verbundindex |
| bvnumber | BV019626430 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV019626430 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T20:01:38Z |
| institution | BVB |
| language | English German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012955671 |
| oclc_num | 254519400 |
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| owner_facet | DE-29 DE-29T |
| physical | X, 172 S. Ill., graph. Darst. |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
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| spelling | Li, Hongzhi Verfasser aut A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li 2004 X, 172 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Erlangen-Nürnberg, Univ., Diss., 2004. - Enth. Zsfassung in dt. und engl. Sprache Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit Mixed-Signal-Schaltung - Built-in self test Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Built-in self test (DE-588)4516486-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Integrierte Schaltung (DE-588)4027242-4 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Built-in self test (DE-588)4516486-1 s b DE-604 |
| spellingShingle | Li, Hongzhi A BIST (built-in self-test) strategy for mixed-signal integrated circuits Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit Mixed-Signal-Schaltung - Built-in self test Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Built-in self test (DE-588)4516486-1 gnd |
| subject_GND | (DE-588)4756481-7 (DE-588)4027242-4 (DE-588)4516486-1 (DE-588)4113937-9 |
| title | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_auth | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_exact_search | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_full | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_fullStr | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_full_unstemmed | A BIST (built-in self-test) strategy for mixed-signal integrated circuits von Hongzhi, Li |
| title_short | A BIST (built-in self-test) strategy for mixed-signal integrated circuits |
| title_sort | a bist built in self test strategy for mixed signal integrated circuits |
| topic | Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit Mixed-Signal-Schaltung - Built-in self test Mixed-Signal-Schaltung (DE-588)4756481-7 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Built-in self test (DE-588)4516486-1 gnd |
| topic_facet | Mixed-Signal-Schaltung - Analog-Digital-Umsetzer - Digital-Analog-Umsetzer - Testbarkeit Mixed-Signal-Schaltung - Built-in self test Mixed-Signal-Schaltung Integrierte Schaltung Built-in self test Hochschulschrift |
| work_keys_str_mv | AT lihongzhi abistbuiltinselfteststrategyformixedsignalintegratedcircuits |