Secondary ion mass spectrometry: proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Chichester u.a.
Wiley
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| Subjects: | |
| Item Description: | Als Ms. gedruckt: UMI Books on Demand, 2003 |
| ISBN: | 0471918326 |
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MARC
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Record in the Search Index
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| discipline | Chemie / Pharmazie |
| format | Conference Proceeding Book |
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| spelling | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 ed.: A Benninghoven ... Chichester u.a. Wiley txt rdacontent n rdamedia nc rdacarrier Als Ms. gedruckt: UMI Books on Demand, 2003 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1987 Paris gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Benninghoven, Alfred Sonstige oth SIMS 6 1987 Versailles Sonstige (DE-588)5000470-0 oth |
| spellingShingle | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 |
| title_auth | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 |
| title_exact_search | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 |
| title_full | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 ed.: A Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 ed.: A Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 ed.: A Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry proceedings of the sixth international conference on se condary ion mass spectrometry sims vi palais des congres versailles paris france september 13 18th 1987 |
| title_sub | proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987 |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift 1987 Paris |
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