Secondary ion mass spectrometry: Proceedings of the Sixth International Conference on Se condary Ion Mass Spectrometry (SIMS VI), Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Wiley.
Chicago Style (17th ed.) CitationSecondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Se Condary Ion Mass Spectrometry (SIMS VI), Palais Des Congrès, Versailles, Paris, France, September 13-18th, 1987. Chichester u.a: Wiley.
MLA (9th ed.) CitationSecondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Se Condary Ion Mass Spectrometry (SIMS VI), Palais Des Congrès, Versailles, Paris, France, September 13-18th, 1987. Wiley.
Warning: These citations may not always be 100% accurate.