Lock-in thermography: basics and use for functional diagnostics of electronic components
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin [u.a.]
Springer
2003
|
| Series: | Advanced microelectronics
10 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | VIII, 193 S. Ill., graph. Darst. |
| ISBN: | 3540434399 |
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Record in the Search Index
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| adam_text | 0. BREITENSTEIN M. LANGENKAMP LOCK-IN THERMOGRAPHY BASICS AND USE FOR
FUNCTIONAL DIAGNOSTICS OF ELECTRONIC COMPONENTS WITH 61 FIGURES
INCLUDING 24 COLOR FIGURES SPRINGER CONTENTS 1. INTRODUCTION 1 2.
PHYSICAL AND TECHNICAL BASICS 7 2.1 IR THERMOGRAPHY BASICS 7 2.2 THE
LOCK-IN PRINCIPLE AND ITS DIGITAL REALIZATION 13 2.3 LOCK-IN
THERMOGRAPHY 20 2.4 INFLUENCE OF NON-HARMONIC HEATING 24 2.5 NOISE
ANALYSIS 29 2.6 CALIBRATION 32 2.7 SYNCHRONOUS UNDERSAMPLING 35 3.
EXPERIMENTAL TECHNIQUE 39 3.1 DIFFERENT (LOCK-IN) THERMOGRAPHY
REALIZATIONS 39 3.2 DYNAMIC PRECISION CONTACT THERMOGRAPHY (DPCT) 49 3.3
IR-CAMERA BASED LOCK-IN THERMOGRAPHY, DSP SOLUTION 55 3.4 THE COMMERCIAL
TDL 384 M LOCK-IN SYSTEM 62 4. THEORY 69 4.1 INFLUENCE OF THE HEAT
CONDUCTION TO THE SURROUNDING 69 4.2 TEMPERATURE DRIFT COMPENSATION 75
4.3 THERMAL WAVES OF POINT SOURCES 82 4.4 THERMAL WAVES OF EXTENDED
SOURCES 87 4.5 THE QUANTITATIVE INTERPRETATION OF LOCK-IN THERMOGRAMS
.... 95 4.5.1 THE IMAGE INTEGRATION METHOD 98 4.5.2 DECONVOLUTION OF
LOCK-IN THERMOGRAMS 105 5. MEASUREMENT STRATEGIES 11 5 5.1 WHICH SIGNAL
SHOULD BE DISPLAYED? 115 5.2 INFLUENCE OF THE LOCK-IN FREQUENCY 121 5.3
INFLUENCE OF THE IR EMISSIVITY 125 5.4 LOCAL I-V CHARACTERISTICS
MEASURED THERMALLY [LIVT] 134 5.5 INFLUENCE OF THE PELTIER EFFECT 138
VIII CONTENTS 6. TYPICAL APPLICATIONS 143 6.1 INTEGRATED CIRCUITS 143
6.2 SOLAR CELLS AND MODULES 150 6.2.1 INHOMOGENEITIES OF SOLAR CELLS 151
6.2.2 FAILURE ANALYSIS OF SOLAR MODULES 157 6.3 GATE OXIDE INTEGRITY
(GOI) DEFECTS 160 6.4 BONDED WAFERS 163 7. SUMMARY AND OUTLOOK 169
REFERENCES 173 A. THERMAL AND IR PROPERTIES OF SELECTED MATERIALS 181 B.
DIGITAL MICROGRAPH SCRIPTS FOR FFT DECONVOLUTION 183 LIST OF SYMBOLS 185
ABBREVIATIONS 189 INDEX 191
|
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| author | Breitenstein, Otwin Langenkamp, Martin |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik |
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| id | DE-604.BV017206433 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:15:00Z |
| institution | BVB |
| isbn | 3540434399 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010369830 |
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| physical | VIII, 193 S. Ill., graph. Darst. |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Springer |
| record_format | marc |
| series | Advanced microelectronics |
| series2 | Advanced microelectronics |
| spelling | Breitenstein, Otwin Verfasser aut Lock-in thermography basics and use for functional diagnostics of electronic components O. Breitenstein ; M. Langenkamp Berlin [u.a.] Springer 2003 VIII, 193 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advanced microelectronics 10 Electronic apparatus and appliances Testing Electronic apparatus and appliances Thermal properties Semiconductors Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 s DE-604 Elektronisches Bauelement (DE-588)4014360-0 s Prüftechnik (DE-588)4047610-8 s Langenkamp, Martin Verfasser aut Advanced microelectronics 10 (DE-604)BV012563021 10 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010369830&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Breitenstein, Otwin Langenkamp, Martin Lock-in thermography basics and use for functional diagnostics of electronic components Advanced microelectronics Electronic apparatus and appliances Testing Electronic apparatus and appliances Thermal properties Semiconductors Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4242353-3 (DE-588)4014360-0 |
| title | Lock-in thermography basics and use for functional diagnostics of electronic components |
| title_auth | Lock-in thermography basics and use for functional diagnostics of electronic components |
| title_exact_search | Lock-in thermography basics and use for functional diagnostics of electronic components |
| title_full | Lock-in thermography basics and use for functional diagnostics of electronic components O. Breitenstein ; M. Langenkamp |
| title_fullStr | Lock-in thermography basics and use for functional diagnostics of electronic components O. Breitenstein ; M. Langenkamp |
| title_full_unstemmed | Lock-in thermography basics and use for functional diagnostics of electronic components O. Breitenstein ; M. Langenkamp |
| title_short | Lock-in thermography |
| title_sort | lock in thermography basics and use for functional diagnostics of electronic components |
| title_sub | basics and use for functional diagnostics of electronic components |
| topic | Electronic apparatus and appliances Testing Electronic apparatus and appliances Thermal properties Semiconductors Thermal properties Thermography Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Electronic apparatus and appliances Testing Electronic apparatus and appliances Thermal properties Semiconductors Thermal properties Thermography Prüftechnik Infrarotthermographie Elektronisches Bauelement |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010369830&sequence=000003&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV012563021 |
| work_keys_str_mv | AT breitensteinotwin lockinthermographybasicsanduseforfunctionaldiagnosticsofelectroniccomponents AT langenkampmartin lockinthermographybasicsanduseforfunctionaldiagnosticsofelectroniccomponents |