APA (7th ed.) Citation

Breitenstein, O., & Langenkamp, M. (2003). Lock-in thermography: Basics and use for functional diagnostics of electronic components. Springer.

Chicago Style (17th ed.) Citation

Breitenstein, Otwin, and Martin Langenkamp. Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components. Berlin [u.a.]: Springer, 2003.

MLA (9th ed.) Citation

Breitenstein, Otwin, and Martin Langenkamp. Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components. Springer, 2003.