X-ray microscopy 2002: 7th International Conference on X-Ray Microscopy ; ESRF, Grenoble, France, July 28 - August 2, 2002
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Les Ulis EDP Sciences 2003
Series:Journal de physique 4, Colloque ; 104
Subjects:
Physical Description:XXXIII, 667 S. Ill., graph. Darst.
ISBN:286883664X

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