Laser interferometry X: [2] Applications : 2 - 3 August 2000, San Diego, USA
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 2000
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 4101,2
Subjects:
Physical Description:XI S., S. 291 - 602 Ill., graph. Darst.

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