2001 IEEE International Reliability Physics Symposium proceedings: 39th annual ; Orlando, Florida April 30-May 3, 2001
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Piscataway, NJ
2001
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| Subjects: | |
| Physical Description: | X, 464 S. Ill., graph. Darst. |
| ISBN: | 0780365879 0780365887 0780365895 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV017008363 | ||
| 003 | DE-604 | ||
| 005 | 20030326 | ||
| 007 | t | ||
| 008 | 030326s2001 ad||j |||| 10||| eng d | ||
| 020 | |a 0780365879 |9 0-7803-6587-9 | ||
| 020 | |a 0780365887 |9 0-7803-6588-7 | ||
| 020 | |a 0780365895 |9 0-7803-6589-5 | ||
| 035 | |a (OCoLC)47050962 | ||
| 035 | |a (DE-599)BVBBV017008363 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1050 |a DE-83 | ||
| 050 | 0 | |a TK7870 | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 111 | 2 | |a International Reliability Physics Symposium |n 39 |d 2001 |c Orlando, Fla. |j Verfasser |0 (DE-588)6033517-8 |4 aut | |
| 245 | 1 | 0 | |a 2001 IEEE International Reliability Physics Symposium proceedings |b 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| 246 | 1 | 3 | |a Two-Thousand and One IEEE International Reliability Physics Symposium proceedings |
| 264 | 1 | |a Piscataway, NJ |c 2001 | |
| 300 | |a X, 464 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Reliability |v Congresses | |
| 650 | 0 | 7 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2001 |z Orlando Fla. |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronisches Bauelement |0 (DE-588)4014360-0 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-010268581 | ||
Record in the Search Index
| _version_ | 1804129917424631808 |
|---|---|
| any_adam_object | |
| author_corporate | International Reliability Physics Symposium Orlando, Fla |
| author_corporate_role | aut |
| author_facet | International Reliability Physics Symposium Orlando, Fla |
| author_sort | International Reliability Physics Symposium Orlando, Fla |
| building | Verbundindex |
| bvnumber | BV017008363 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)47050962 (DE-599)BVBBV017008363 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01546nam a2200397 c 4500</leader><controlfield tag="001">BV017008363</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20030326 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">030326s2001 ad||j |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780365879</subfield><subfield code="9">0-7803-6587-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780365887</subfield><subfield code="9">0-7803-6588-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780365895</subfield><subfield code="9">0-7803-6589-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)47050962</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV017008363</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7870</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="n">39</subfield><subfield code="d">2001</subfield><subfield code="c">Orlando, Fla.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)6033517-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">2001 IEEE International Reliability Physics Symposium proceedings</subfield><subfield code="b">39th annual ; Orlando, Florida April 30-May 3, 2001</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Two-Thousand and One IEEE International Reliability Physics Symposium proceedings</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 464 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2001</subfield><subfield code="z">Orlando Fla.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Bauelement</subfield><subfield code="0">(DE-588)4014360-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-010268581</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2001 Orlando Fla. gnd-content |
| genre_facet | Konferenzschrift 2001 Orlando Fla. |
| id | DE-604.BV017008363 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:12:45Z |
| institution | BVB |
| institution_GND | (DE-588)6033517-8 |
| isbn | 0780365879 0780365887 0780365895 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010268581 |
| oclc_num | 47050962 |
| open_access_boolean | |
| owner | DE-1050 DE-83 |
| owner_facet | DE-1050 DE-83 |
| physical | X, 464 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| record_format | marc |
| spelling | International Reliability Physics Symposium 39 2001 Orlando, Fla. Verfasser (DE-588)6033517-8 aut 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 Two-Thousand and One IEEE International Reliability Physics Symposium proceedings Piscataway, NJ 2001 X, 464 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2001 Orlando Fla. gnd-content Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 |
| spellingShingle | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4014360-0 (DE-588)4059245-5 (DE-588)1071861417 |
| title | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_alt | Two-Thousand and One IEEE International Reliability Physics Symposium proceedings |
| title_auth | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_exact_search | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_full | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_fullStr | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_full_unstemmed | 2001 IEEE International Reliability Physics Symposium proceedings 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| title_short | 2001 IEEE International Reliability Physics Symposium proceedings |
| title_sort | 2001 ieee international reliability physics symposium proceedings 39th annual orlando florida april 30 may 3 2001 |
| title_sub | 39th annual ; Orlando, Florida April 30-May 3, 2001 |
| topic | Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Elektronisches Bauelement Zuverlässigkeit Konferenzschrift 2001 Orlando Fla. |
| work_keys_str_mv | AT internationalreliabilityphysicssymposiumorlandofla 2001ieeeinternationalreliabilityphysicssymposiumproceedings39thannualorlandofloridaapril30may32001 AT internationalreliabilityphysicssymposiumorlandofla twothousandandoneieeeinternationalreliabilityphysicssymposiumproceedings |