Applied scanning probe methods:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Berlin [u.a.]
Springer
2004
|
Schriftenreihe: | NanoScience and technology
Physics and astronomy online library |
Schlagworte: | |
Beschreibung: | Literaturangaben |
Beschreibung: | XX, 476 S. Ill., graph. Darst. : 24 cm |
ISBN: | 3540005277 |
Internformat
MARC
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084 | |a PHY 136f |2 stub | ||
245 | 1 | 0 | |a Applied scanning probe methods |c Bharat Bhushan ... [ed.] |
264 | 1 | |a Berlin [u.a.] |b Springer |c 2004 | |
300 | |a XX, 476 S. |b Ill., graph. Darst. : 24 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
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490 | 0 | |a NanoScience and technology | |
490 | 0 | |a Physics and astronomy online library | |
500 | |a Literaturangaben | ||
650 | 4 | |a Materials |x Microscopy | |
650 | 4 | |a Scanning probe microscopy | |
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Datensatz im Suchindex
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any_adam_object | |
author_GND | (DE-588)122258762 |
building | Verbundindex |
bvnumber | BV016972547 |
callnumber-first | T - Technology |
callnumber-label | TA417 |
callnumber-raw | TA417.23 |
callnumber-search | TA417.23 |
callnumber-sort | TA 3417.23 |
callnumber-subject | TA - General and Civil Engineering |
classification_rvk | UH 6310 UH 6320 |
classification_tum | PHY 136f |
ctrlnum | (OCoLC)55122509 (DE-599)BVBBV016972547 |
dewey-full | 620.1/1299 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.1/1299 |
dewey-search | 620.1/1299 |
dewey-sort | 3620.1 41299 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik |
format | Book |
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id | DE-604.BV016972547 |
illustrated | Illustrated |
indexdate | 2024-07-09T19:12:21Z |
institution | BVB |
isbn | 3540005277 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010250095 |
oclc_num | 55122509 |
open_access_boolean | |
owner | DE-91G DE-BY-TUM DE-526 |
owner_facet | DE-91G DE-BY-TUM DE-526 |
physical | XX, 476 S. Ill., graph. Darst. : 24 cm |
publishDate | 2004 |
publishDateSearch | 2004 |
publishDateSort | 2004 |
publisher | Springer |
record_format | marc |
series2 | NanoScience and technology Physics and astronomy online library |
spelling | Applied scanning probe methods Bharat Bhushan ... [ed.] Berlin [u.a.] Springer 2004 XX, 476 S. Ill., graph. Darst. : 24 cm txt rdacontent n rdamedia nc rdacarrier NanoScience and technology Physics and astronomy online library Literaturangaben Materials Microscopy Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Bhushan, Bharat 1949- Sonstige (DE-588)122258762 oth |
spellingShingle | Applied scanning probe methods Materials Microscopy Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
subject_GND | (DE-588)4330328-6 |
title | Applied scanning probe methods |
title_auth | Applied scanning probe methods |
title_exact_search | Applied scanning probe methods |
title_full | Applied scanning probe methods Bharat Bhushan ... [ed.] |
title_fullStr | Applied scanning probe methods Bharat Bhushan ... [ed.] |
title_full_unstemmed | Applied scanning probe methods Bharat Bhushan ... [ed.] |
title_short | Applied scanning probe methods |
title_sort | applied scanning probe methods |
topic | Materials Microscopy Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
topic_facet | Materials Microscopy Scanning probe microscopy Rastersondenmikroskopie |
work_keys_str_mv | AT bhushanbharat appliedscanningprobemethods |