Transient temperature phenomena during sublimation growth of silicon carbide single crystals:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
WIAS
2002
|
| Schriftenreihe: | Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V.
755 |
| Beschreibung: | Literaturverz. S. 11 - 14 |
| Beschreibung: | 14 S. graph. Darst. : 30 cm |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV016463902 | ||
| 003 | DE-604 | ||
| 005 | 20031202 | ||
| 007 | t | ||
| 008 | 030122s2002 gw d||| |||| 00||| eng d | ||
| 016 | 7 | |a 965837645 |2 DE-101 | |
| 035 | |a (OCoLC)51699315 | ||
| 035 | |a (DE-599)BVBBV016463902 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-355 | ||
| 084 | |a SI 304 |0 (DE-625)143111: |2 rvk | ||
| 100 | 1 | |a Klein, Olaf |d 1966- |e Verfasser |0 (DE-588)118002082 |4 aut | |
| 245 | 1 | 0 | |a Transient temperature phenomena during sublimation growth of silicon carbide single crystals |c Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |
| 264 | 1 | |a Berlin |b WIAS |c 2002 | |
| 300 | |a 14 S. |b graph. Darst. : 30 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |v 755 | |
| 500 | |a Literaturverz. S. 11 - 14 | ||
| 700 | 1 | |a Philip, Peter |d 1971- |e Verfasser |0 (DE-588)124765084 |4 aut | |
| 810 | 2 | |a Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |t Preprint |v 755 |w (DE-604)BV009885922 |9 755 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-010178517 | ||
Datensatz im Suchindex
| _version_ | 1804129793839464448 |
|---|---|
| any_adam_object | |
| author | Klein, Olaf 1966- Philip, Peter 1971- |
| author_GND | (DE-588)118002082 (DE-588)124765084 |
| author_facet | Klein, Olaf 1966- Philip, Peter 1971- |
| author_role | aut aut |
| author_sort | Klein, Olaf 1966- |
| author_variant | o k ok p p pp |
| building | Verbundindex |
| bvnumber | BV016463902 |
| classification_rvk | SI 304 |
| ctrlnum | (OCoLC)51699315 (DE-599)BVBBV016463902 |
| discipline | Mathematik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01333nam a2200325 cb4500</leader><controlfield tag="001">BV016463902</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20031202 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">030122s2002 gw d||| |||| 00||| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">965837645</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)51699315</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV016463902</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SI 304</subfield><subfield code="0">(DE-625)143111:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Klein, Olaf</subfield><subfield code="d">1966-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)118002082</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Transient temperature phenomena during sublimation growth of silicon carbide single crystals</subfield><subfield code="c">Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">WIAS</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">14 S.</subfield><subfield code="b">graph. Darst. : 30 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V.</subfield><subfield code="v">755</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 11 - 14</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Philip, Peter</subfield><subfield code="d">1971-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)124765084</subfield><subfield code="4">aut</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V.</subfield><subfield code="t">Preprint</subfield><subfield code="v">755</subfield><subfield code="w">(DE-604)BV009885922</subfield><subfield code="9">755</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-010178517</subfield></datafield></record></collection> |
| id | DE-604.BV016463902 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:10:47Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-010178517 |
| oclc_num | 51699315 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | 14 S. graph. Darst. : 30 cm |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | WIAS |
| record_format | marc |
| series2 | Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |
| spelling | Klein, Olaf 1966- Verfasser (DE-588)118002082 aut Transient temperature phenomena during sublimation growth of silicon carbide single crystals Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. Berlin WIAS 2002 14 S. graph. Darst. : 30 cm txt rdacontent n rdamedia nc rdacarrier Preprint / Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. 755 Literaturverz. S. 11 - 14 Philip, Peter 1971- Verfasser (DE-588)124765084 aut Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. Preprint 755 (DE-604)BV009885922 755 |
| spellingShingle | Klein, Olaf 1966- Philip, Peter 1971- Transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| title | Transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| title_auth | Transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| title_exact_search | Transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| title_full | Transient temperature phenomena during sublimation growth of silicon carbide single crystals Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |
| title_fullStr | Transient temperature phenomena during sublimation growth of silicon carbide single crystals Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |
| title_full_unstemmed | Transient temperature phenomena during sublimation growth of silicon carbide single crystals Olaf Klein ; Peter Philip. Weierstraß-Institut für Angewandte Analysis und Stochastik im Forschungsverbund Berlin e.V. |
| title_short | Transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| title_sort | transient temperature phenomena during sublimation growth of silicon carbide single crystals |
| volume_link | (DE-604)BV009885922 |
| work_keys_str_mv | AT kleinolaf transienttemperaturephenomenaduringsublimationgrowthofsiliconcarbidesinglecrystals AT philippeter transienttemperaturephenomenaduringsublimationgrowthofsiliconcarbidesinglecrystals |