Logik im Patentrecht: objektive Fundamente der Urteilsbildung
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Bibliographic Details
Main Author: Stamm, Kurt (Author)
Format: Book
Language:German
Published: Köln ; Berlin ; Bonn ; München Heymann 2002
Subjects:
Physical Description:XVIII, 403 S. 21 cm
ISBN:3452252760

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!