Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002): 10 - 12 July, 2002, Isle of Bendor, France
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
2002
|
| Schlagworte: | |
| Beschreibung: | XII, 182 S. Ill., graph. Darst. |
| ISBN: | 0769516173 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV014581325 | ||
| 003 | DE-604 | ||
| 005 | 20020905 | ||
| 007 | t | ||
| 008 | 020722s2002 ad|| |||| 10||| eng d | ||
| 020 | |a 0769516173 |9 0-7695-1617-3 | ||
| 035 | |a (OCoLC)50761453 | ||
| 035 | |a (DE-599)BVBBV014581325 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-739 | ||
| 050 | 0 | |a TK7895.M4 | |
| 082 | 0 | |a 621.39/732 |2 22 | |
| 084 | |a SS 2002 |0 (DE-625)143439: |2 rvk | ||
| 111 | 2 | |a International Workshop on Memory Technology, Design and Testing |n 10 |d 2002 |c Bandol |j Verfasser |0 (DE-588)10072247-7 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) |b 10 - 12 July, 2002, Isle of Bendor, France |c eds. Bernard Courtois ... |
| 246 | 1 | 3 | |a MTDT 2002 |
| 246 | 1 | 3 | |a Memory technology, design and testing |
| 246 | 1 | 3 | |a Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing |
| 264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. |c 2002 | |
| 300 | |a XII, 182 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Random access memory |v Congresses | |
| 650 | 4 | |a Semiconductor storage devices |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Courtois, Bernard |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009912464 | ||
Datensatz im Suchindex
| _version_ | 1804129357820592129 |
|---|---|
| any_adam_object | |
| author_corporate | International Workshop on Memory Technology, Design and Testing Bandol |
| author_corporate_role | aut |
| author_facet | International Workshop on Memory Technology, Design and Testing Bandol |
| author_sort | International Workshop on Memory Technology, Design and Testing Bandol |
| building | Verbundindex |
| bvnumber | BV014581325 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.M4 |
| callnumber-search | TK7895.M4 |
| callnumber-sort | TK 47895 M4 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | SS 2002 |
| ctrlnum | (OCoLC)50761453 (DE-599)BVBBV014581325 |
| dewey-full | 621.39/732 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/732 |
| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01464nam a2200373 c 4500</leader><controlfield tag="001">BV014581325</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020905 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">020722s2002 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0769516173</subfield><subfield code="9">0-7695-1617-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)50761453</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV014581325</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.M4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/732</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SS 2002</subfield><subfield code="0">(DE-625)143439:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Workshop on Memory Technology, Design and Testing</subfield><subfield code="n">10</subfield><subfield code="d">2002</subfield><subfield code="c">Bandol</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)10072247-7</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002)</subfield><subfield code="b">10 - 12 July, 2002, Isle of Bendor, France</subfield><subfield code="c">eds. Bernard Courtois ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">MTDT 2002</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Memory technology, design and testing</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc.</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 182 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Random access memory</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor storage devices</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Courtois, Bernard</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009912464</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV014581325 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T19:03:51Z |
| institution | BVB |
| institution_GND | (DE-588)10072247-7 |
| isbn | 0769516173 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009912464 |
| oclc_num | 50761453 |
| open_access_boolean | |
| owner | DE-739 |
| owner_facet | DE-739 |
| physical | XII, 182 S. Ill., graph. Darst. |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | IEEE Computer Soc. |
| record_format | marc |
| spelling | International Workshop on Memory Technology, Design and Testing 10 2002 Bandol Verfasser (DE-588)10072247-7 aut Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France eds. Bernard Courtois ... MTDT 2002 Memory technology, design and testing Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 2002 XII, 182 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Random access memory Congresses Semiconductor storage devices Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Courtois, Bernard Sonstige oth |
| spellingShingle | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France Random access memory Congresses Semiconductor storage devices Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France |
| title_alt | MTDT 2002 Memory technology, design and testing Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing |
| title_auth | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France |
| title_exact_search | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France |
| title_full | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France eds. Bernard Courtois ... |
| title_fullStr | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France eds. Bernard Courtois ... |
| title_full_unstemmed | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) 10 - 12 July, 2002, Isle of Bendor, France eds. Bernard Courtois ... |
| title_short | Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) |
| title_sort | proceedings of the 2002 ieee international workshop on memory technology design and testing mtdt 2002 10 12 july 2002 isle of bendor france |
| title_sub | 10 - 12 July, 2002, Isle of Bendor, France |
| topic | Random access memory Congresses Semiconductor storage devices Testing Congresses |
| topic_facet | Random access memory Congresses Semiconductor storage devices Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalworkshoponmemorytechnologydesignandtestingbandol proceedingsofthe2002ieeeinternationalworkshoponmemorytechnologydesignandtestingmtdt20021012july2002isleofbendorfrance AT courtoisbernard proceedingsofthe2002ieeeinternationalworkshoponmemorytechnologydesignandtestingmtdt20021012july2002isleofbendorfrance AT internationalworkshoponmemorytechnologydesignandtestingbandol mtdt2002 AT courtoisbernard mtdt2002 AT internationalworkshoponmemorytechnologydesignandtestingbandol memorytechnologydesignandtesting AT courtoisbernard memorytechnologydesignandtesting AT internationalworkshoponmemorytechnologydesignandtestingbandol recordsofthe2002ieeeinternationalworkshoponmemorytechnologydesignandtesting AT courtoisbernard recordsofthe2002ieeeinternationalworkshoponmemorytechnologydesignandtesting |